CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1997 vol.19 Issue No.07 - July
Issue No.07 - July (1997 vol.19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.598237
<p><b>Abstract</b>—In this work, we address the problem of performance evaluation in biometric verification systems. By formulating the optimum Bayesian decision criterion for a verification system and by assuming the data distributions to be multinormals, we derive two statistical expressions for calculating theoretically the false acceptance and false rejection rates. Generally, the adoption of a Bayesian parametric model does not allow for obtaining explicit expressions for the calculation of the system errors. As far as biometric verification systems are concerned, some hypotheses can be reasonably adopted, thus allowing simple and affordable expressions to be derived. By using two verification system prototypes, based on hand shape and human face, respectively, we show our results are well founded.</p>
Biometric verification systems, statistical pattern recognition, Bayes error rate, rejection error rate, hand geometry, human face.
Matteo Golfarelli, Davide Maltoni, "On the Error-Reject Trade-Off in Biometric Verification Systems", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.19, no. 7, pp. 786-796, July 1997, doi:10.1109/34.598237