CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1997 vol.19 Issue No.04 - April
Issue No.04 - April (1997 vol.19)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.587996
<p><b>Abstract</b>—Fingerprint verification is one of the most reliable personal identification methods. However, manual fingerprint verification is so tedious, time-consuming, and expensive that it is incapable of meeting today's increasing performance requirements. An automatic fingerprint identification system (AFIS) is widely needed. It plays a very important role in forensic and civilian applications such as criminal identification, access control, and ATM card verification. This paper describes the design and implementation of an on-line fingerprint verification system which operates in two stages: minutia extraction and minutia matching. An improved version of the minutia extraction algorithm proposed by Ratha et al., which is much faster and more reliable, is implemented for extracting features from an input fingerprint image captured with an on-line inkless scanner. For minutia matching, an alignment-based elastic matching algorithm has been developed. This algorithm is capable of finding the correspondences between minutiae in the input image and the stored template without resorting to exhaustive search and has the ability of adaptively compensating for the nonlinear deformations and inexact pose transformations between fingerprints. The system has been tested on two sets of fingerprint images captured with inkless scanners. The verification accuracy is found to be acceptable. Typically, a complete fingerprint verification procedure takes, on an average, about eight seconds on a SPARC 20 workstation. These experimental results show that our system meets the response time requirements of on-line verification with high accuracy.</p>
Biometrics, fingerprints, matching, verification, minutia, orientation field, ridge extraction.
Lin Hong, Anil Jain, "On-Line Fingerprint Verification", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.19, no. 4, pp. 302-314, April 1997, doi:10.1109/34.587996