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| Michael Werman, Daphna Weinshall, "Similarity and Affine Invariant Distances Between 2D Point Sets," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 17, no. 8, pp. 810-814, August, 1995. | |||
| BibTex | x | ||
| @article{ 10.1109/34.400572, author = {Michael Werman and Daphna Weinshall}, title = {Similarity and Affine Invariant Distances Between 2D Point Sets}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {17}, number = {8}, issn = {0162-8828}, year = {1995}, pages = {810-814}, doi = {http://doi.ieeecomputersociety.org/10.1109/34.400572}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Pattern Analysis and Machine Intelligence TI - Similarity and Affine Invariant Distances Between 2D Point Sets IS - 8 SN - 0162-8828 SP810 EP814 EPD - 810-814 A1 - Michael Werman, A1 - Daphna Weinshall, PY - 1995 KW - Image matching KW - pattern analysis KW - 2D affine invariance KW - 2D similarity invariance KW - image metric. VL - 17 JA - IEEE Transactions on Pattern Analysis and Machine Intelligence ER - | |||
[1] K. Fukunaga, Introduction to Statistical Pattern Recognition, second edition. Academic Press, 1990.
[2] G.H. Golub and C.F. Van Loan,Matrix Computations.Baltimore: Johns Hopkins Univ. Press, 1989.
[3] A. Rosenfeld and A.C. Kak,Digital Picture Processing. Academic Press, 2nd ed., 1982
[4] J. Sprinzak and M. Werman,“Affine point matching,” Pattern Recognition Letters, 1993.
[5] D. Weinshall,M. Werman,, and N. Tishby,“Stability and likelihood of views of three dimensional objects,” ECCV, pp. 24-35, 1994.

