CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1995 vol.17 Issue No.02 - February
Issue No.02 - February (1995 vol.17)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/34.368167
<p><it>Abstract</it>—This correspondence presents a statistically sound, simple and, fast method to estimate the parameters of a second degree curve from a set of noisy points that originated from the curve.</p>
Pattern analysis, low-level processing, perceptual grouping, curve fitting.
Michael Werman, "Fitting a Second Degree Curve in the Presence of Error", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.17, no. 2, pp. 207-211, February 1995, doi:10.1109/34.368167