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R.K.K. Yip, P.K.S. Tam, D.N.K. Leung, "Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 16, no. 3, pp. 277286, March, 1994.  
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@article{ 10.1109/34.276127, author = {R.K.K. Yip and P.K.S. Tam and D.N.K. Leung}, title = {Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {16}, number = {3}, issn = {01628828}, year = {1994}, pages = {277286}, doi = {http://doi.ieeecomputersociety.org/10.1109/34.276127}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Pattern Analysis and Machine Intelligence TI  Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection IS  3 SN  01628828 SP277 EP286 EPD  277286 A1  R.K.K. Yip, A1  P.K.S. Tam, A1  D.N.K. Leung, PY  1994 KW  invariance; iterative methods; computer vision; series (mathematics); elliptic Fourier descriptors; symmetry detection; parallel projection; arc length parameterization; iteration algorithm; invariants; planar object recognition VL  16 JA  IEEE Transactions on Pattern Analysis and Machine Intelligence ER   
In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed.
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