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Issue No.03 - March (1994 vol.16)
pp: 277-286
ABSTRACT
<p>In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed.</p>
INDEX TERMS
invariance; iterative methods; computer vision; series (mathematics); elliptic Fourier descriptors; symmetry detection; parallel projection; arc length parameterization; iteration algorithm; invariants; planar object recognition
CITATION
R.K.K. Yip, P.K.S. Tam, D.N.K. Leung, "Application of Elliptic Fourier Descriptors to Symmetry Detection Under Parallel Projection", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.16, no. 3, pp. 277-286, March 1994, doi:10.1109/34.276127
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