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| J. Cooper, S. Venkatesh, L. Kitchen, "Early Jump-Out Corner Detectors," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 15, no. 8, pp. 823-828, August, 1993. | |||
| BibTex | x | ||
| @article{ 10.1109/34.236246, author = {J. Cooper and S. Venkatesh and L. Kitchen}, title = {Early Jump-Out Corner Detectors}, journal ={IEEE Transactions on Pattern Analysis and Machine Intelligence}, volume = {15}, number = {8}, issn = {0162-8828}, year = {1993}, pages = {823-828}, doi = {http://doi.ieeecomputersociety.org/10.1109/34.236246}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Pattern Analysis and Machine Intelligence TI - Early Jump-Out Corner Detectors IS - 8 SN - 0162-8828 SP823 EP828 EPD - 823-828 A1 - J. Cooper, A1 - S. Venkatesh, A1 - L. Kitchen, PY - 1993 KW - early jump out corner detectors; image curvature estimation; edge detection; dissimilarity; contour direction; image contour; edge detection VL - 15 JA - IEEE Transactions on Pattern Analysis and Machine Intelligence ER - | |||
The authors present two new corner detectors. One works by using dissimilarity, along the contour direction to detect curves in the image contour, and the other estimates image curvature along the contour direction. These operators are fast, robust to noise, and require no subjective thresholding.
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