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Surface Parametrization and Curvature Measurement of Arbitrary 3-D Objects: Five Practical Methods
August 1992 (vol. 14 no. 8)
pp. 833-840

Curvature sampling of arbitrary, fully described 3-D objects (e.g. tomographic medical images) is difficult because of surface patch parameterization problems. Five practical solutions are presented and characterized-the Sander-Zucker approach, two novel methods based on direct surface mapping, a piecewise linear manifold technique, and a turtle geometry method. One of the new methods, called the cross patch (CP) method, is shown to be very fast, robust in the presence of noise, and is always based on a proper surface parameterization, provided the perturbations of the surface over the patch neighborhood are isotropically distributed.

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Index Terms:
3D images; curvature sampling; picture processing; shape recognition; curvature measurement; surface patch parameterization; Sander-Zucker approach; direct surface mapping; piecewise linear manifold technique; turtle geometry method; cross patch; pattern recognition; picture processing
Citation:
E.M. Stokely, S.Y. Wu, "Surface Parametrization and Curvature Measurement of Arbitrary 3-D Objects: Five Practical Methods," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 14, no. 8, pp. 833-840, Aug. 1992, doi:10.1109/34.149594
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