Searching...
Advanced Search
Publication
1989
Issue No. 10 - October
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
RSS feed for this Publication
Bibliographic References
ASCII Text
BibTex
RefWorks Procite/RefMan/EndNote
IEEE Transactions on Pattern Analysis and Machine Intelligence
October 1989 (vol. 11 no. 10)
ISSN: 0162-8828
Table of Contents
Editor's Notice
Editor's Notice
(Abstract)
S.L. Tanimoto
pp. 1009
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
PAPERS
Image Flow Segmentation and Estimation by Constraint Line Clustering
(Abstract)
B.G. Schunck
pp. 1010-1027
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Toward a Model-Based Bayesian Theory for Estimating and Recognizing Parameterized 3-D Objects Using Two or More Images Taken from Different Positions
(Abstract)
B. Cernuschi-Frias
D.B. Cooper
Y.P. Hung
P.N. Belhumeur
pp. 1028-1052
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
3-D Moment Forms: Their Construction and Application to Object Identification and Positioning
(Abstract)
C.H. Lo
H.S. Don
pp. 1053-1064
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Geometric Precision in Noise-Free Digital Images
(Abstract)
D.I. Havelock
pp. 1065-1075
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Skeletonization via the Realization of the Fire Front's Propagation and Extinction in Digital Binary Shapes
(Abstract)
Y. Xia
pp. 1076-1086
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Estimation of Classifier Performance
(Abstract)
K. Fukunaga
R.R. Hayes
pp. 1087-1101
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
CORRESPONDENCE
Obstacle Avoidance Using Flow Field Divergence
(Abstract)
R.C. Nelson
J. Aloimonos
pp. 1102-1106
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Localization and Noise in Edge Detection
(Abstract)
E. De Micheli
B. Caprile
P. Ottonello
V. Torre
pp. 1106-1117
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Line-Drawing Interpretation: Bilateral Symmetry
(Abstract)
V.S. Nalwa
pp. 1117-1120
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download
Print and Online Advertising Opportunities