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Issue No.04 - April (1989 vol.11)
pp: 390-402
ABSTRACT
<p>A method for 3-D surface measurement using a projected grid of light is presented. The grid line identification problem is solved using very general constraints. At the same time, 3-D surface patch solutions are developed. From the general constraints of set of geometric and topological rules are derived that are effectively applied in the computation of grid labels and hence 3-D surface solutions. A set of five algorithms has been applied on five real scenes consisting of multiple objects of arbitrary shapes. The results show that globally consistent surface solutions can be obtained rapidly with good accuracy using a single image. A small degree of ambiguity remains, but can be further reduced or removed using increased knowledge.</p>
INDEX TERMS
3D surface measurement; topology; geometry; computerised picture processing; pattern recognition; structured light; constraint propagation; grid line identification; computerised pattern recognition; computerised picture processing; topology
CITATION
"3-D Surface Solution Using Structured Light and Constraint Propagation", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.11, no. 4, pp. 390-402, April 1989, doi:10.1109/34.19035
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