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Issue No.04 - July (1988 vol.10)
pp: 496-513
ABSTRACT
<p>Various types of moments have been used to recognize image patterns in a number of applications. A number of moments are evaluated and some fundamental questions are addressed, such as image-representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments, and complex moments. Properties of these moments are examined in detail and the interrelationships among them are discussed. Both theoretical and experimental results are presented.</p>
INDEX TERMS
picture processing; pattern recognition; image analysis; image-representation; noise sensitivity; information redundancy; regular moments; Legendre moments; Zernike moments; rotational moments; complex moments; pattern recognition; picture processing
CITATION
C.H. Teh, R.T. Chin, "On Image Analysis by the Methods of Moments", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.10, no. 4, pp. 496-513, July 1988, doi:10.1109/34.3913
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