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Structured Highlight Inspection of Specular Surfaces
January 1988 (vol. 10 no. 1)
pp. 44-55

An approach to illumination and imaging of specular surfaces that yields three-dimensional shape information is described. The structured highlight approach uses a scanned array of point sources and images of the resulting reflected highlights to compute local surface height and orientation. A prototype structured highlight inspection system, called SHINY, has been implemented. SHINY demonstrates the determination of surface shape for several test objects including solder joints. The current SHINY system makes the distant-source assumption and requires only one camera. A stereo structured highlight system using two cameras is proposed to determine surface-element orientation for objects in a much larger field of view. Analysis and description of the algorithms are included. The proposed structured highlight techniques are promising for many industrial tasks.

[1] B. K. P. Horn, "Determining shape from shading," inThe Psychology of Computer Vision, P. H. Winston, Ed. New York: McGraw-Hill, 1975.
[2] B. K. P. Horn, "Image intensity understanding,"Artificial Intell., vol. 8, no. 2, 1977.
[3] K. Ikeuchi, "Numerical shape from shading and occluding contours in a single view," Artificial Intelligence Lab., M.I.T., Cambridge, AI Memo 566, 1980.
[4] R. J. Woodham, "Photometric stereo: A reflectance map technique for determining surface orientation from image intensity,"Proc. SPIE, vol. 155, pp. 136-143, 1978.
[5] R. J. Woodham, "Photometric method for determining surface orientation from multiple images,"Opt. Eng., vol. 19, no. 1, pp. 139-144, 1980.
[6] B. K. P. Horn and K. Ikeuchi, "The mechanical manipulation of randomly oriented parts,"Sci. Amer., vol. 251, no. 2, pp. 100-111, Aug. 1984.
[7] E. N. Coleman and R. Jain, "Obtaining 3-dimensional shape of textured and specular surface using four-source photometry,"Comput. Graphics Image Processing, vol. 18, no. 4, pp. 309-328, Apr. 1982.
[8] G. Agin, "Representation and description of curved objects," Stanford Univ., AI Memo, Oct. 1972.
[9] J. G. Davy, "A comprehensive list of wave solder defects and their probable causes,"Brazing and Soldering, no. 9, pp. 50-59, Autumn 1985.
[10] P. J. Besl, E. J. Delp, and R. C. Jain, "Automatic visual solder joint inspection,"IEEE J. Robotics Automation, vol. RA-1, pp. 42-56, Mar. 1985.
[11] P. A. Merrill and M. D. Levine, "Visual inspection of solder joints by computer," McGill Univ., Rep. TR-85-1R, Jan. 1985.
[12] Y. Nakagawa, "Automatic visual inspection of solder joints on printed circuit boards,"SPIE Robot Vision, vol. 336, pp. 121-127, 1982.
[13] R. Vanzetti, A. C. Traub, and J. S. Ele, "Hidden solder joint defects detected by laser infrared system," inProc. IPC 24th Annu. Meeting, Apr. 1981, pp. 1-15.
[14] K. Ikeuchi, "Determining surface orientations of specular surfaces by using the photometric stereo method,"IEEE Trans. Pattern Anal. Machine Intell., vol. PAMI-3, pp. 661-669, Nov. 1981.
[15] M. D. R. Babu, C-H. Lee, and A. Rosenfeld, "Determining plane orientation from specular reflectance,"Pattern Recognition, vol. 18, no. 1, pp. 53-62, 1985.
[16] B. K. P. Horn and R. W. Sjoberg, "Calculating the reflectance map,"Appl. Opt., vol. 18, no. 1, pp. 1770-1779.
[17] R. Bracho, J. F. Schlag, and A. C. Sanderson, "POPEYE: A gray-level vision system for robotics applications," Robotics Inst., Carnegie-Mellon Univ., Rep. CMU-RI-TR-83-6.
[18] D. Marr and T. Poggio, "Cooperative computation of stereo disparity,"Science, vol. 194, pp. 283-287, 1976.

Index Terms:
structured light; computer vision; surface orientation; specular surfaces; illumination; imaging; three-dimensional shape information; scanned array; local surface height; SHINY; distant-source assumption; stereo structured highlight; computer vision; computerised picture processing
Citation:
A.S. Sanderson, L.E. Weiss, S.K. Nayar, "Structured Highlight Inspection of Specular Surfaces," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 10, no. 1, pp. 44-55, Jan. 1988, doi:10.1109/34.3866
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