This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Introduction to the Special PAMI Issues on Industrial Machine Vision and Computer Vision Technology
January 1988 (vol. 10 no. 1)
pp. 1-3

[1] E. W. Blanz, J. L. C. Sanz, and E. B. Hinkle, "Image analysis methods for solder ball inspection in integrated circuit manufacturing,"IEEE J. Robotics and Automation, to be published.
[2] P. Ruetz and R. Brodersen, "An image recognition system using algorithmically dedicated integrated circuits,"Machine Vision and Applications, An International Journal, 1988, to be published.

Citation:
J.L.C. Sanz, "Introduction to the Special PAMI Issues on Industrial Machine Vision and Computer Vision Technology," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 10, no. 1, pp. 1-3, Jan. 1988, doi:10.1109/TPAMI.1988.10000
Usage of this product signifies your acceptance of the Terms of Use.