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IEEE Transactions on Pattern Analysis and Machine Intelligence
April 1987 (vol. 9 no. 4)
ISSN: 0162-8828
Table of Contents
Papers
W. Eric L. Grimson, M.I.T. Artificial Intelligence Laboratory, 545 Technology Square, Cambridge, MA 02139.
Tomas Lozano-Perez, M.I.T. Artificial Intelligence Laboratory, 545 Technology Square, Cambridge, MA 02139.
pp. 469-482
Mark W. Koch, Department of Electrical and Computer Engineering, Clarkson University, Potsdam, NY 13676.
Rangasami L. Kashyap, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 483-494
Andreas R. Dill, Computer Vision and Robotics Laboratory, McGill Research Centre for Intelligent Machines, McGill University, Montreal, P.Q. H3A 2A7, Canada; Zevatech AG, Bellach, Switzerland.
Martin D. Levine, Computer Vision and Robotics Laboratory, McGill Research Centre for Intelligent Machines, McGill University, Montreal, P.Q. H3A 2A7, Canada; Canadian Institute for Advanced Researc
Peter B. Noble, Faculties of Medicine and Dentistry, McGill University, Montreal, P.Q. H3A 2A7, Canada.
pp. 495-504
Stephen M. Pizer, Department of Computer Science and the Department of Radiology, University of North Carolina, Chapel Hill, NC 27514.
William R. Oliver, Department of Computer Science and the Department of Pathology, University of North Carolina, Chapel Hill, NC 27514.
Sandra H. Bloomberg, Department of Computer Science, University of North Carolina, Chapel Hill, NC 27514.
pp. 505-511
Peter Meer, Center for Automation Research, University of Maryland, College Park, MD 20742.
Ernest S. Baugher, Center for Automation Research, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Center for Automation Research, University of Maryland, College Park, MD 20742.
pp. 512-522
Alex Paul Pentland, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025; Center for the Study of Language and Information, Stanford University, Stanford, CA 94305.
pp. 523-531
Robert M. Haralick, Department of Electrical Engineering, University of Washington, Seattle, WA 98195.
Stanley R. Sternberg, Machine Vision International, Ann Arbor, MI 48104.
Xinhua Zhuang, Department of Electrical Engineering, University of Washington, Seattle, WA 98195; Zhejiang Institute of Computing, Zhejiang, China.
pp. 532-550
Richard L. Hoffman, Department of Computer Science, Michigan State University, East Lansing, MI 48824; Department of Electrical Engineering and Computer Science, University of Illinois at Chicago, Chi
Anil K. Jain, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
pp. 551-560
Jiro Ihara, Systems Engineering Section, Energy Systems Division, Electrotechnical Laboratory, 1-1-4 Umezono, Sakura-mura, Niihari-gun, Ibaraki 305, Japan.
pp. 561-568
Amlan Kundu, Department of Electrical Engineering, State University of New York, Amherst Campus, Buffalo, NY 14260.
Sanjit K. Mitra, Signal Processing Laboratory, Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106.
pp. 569-577
R. J. Schalkoff, Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29631.
pp. 578-584
J. S. Chen, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
A. Huertas, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
G. Medioni, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
pp. 584-590
S.-Y. Lee, Computer and Vision Research Center, College of Engineering, University of Texas at Austin, Austin, TX 78712.
J. K. Aggarwal, Computer and Vision Research Center, College of Engineering, University of Texas at Austin, Austin, TX 78712.
pp. 590-594
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