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IEEE Transactions on Pattern Analysis and Machine Intelligence
March 1987 (vol. 9 no. 3)
ISSN: 0162-8828
Table of Contents
Papers
Yvan G. Leclerc, Artificial Intelligence Center, SRI International, Menlo Park, CA 96025.
Steven W. Zucker, Computer Vision and Robotics Laboratory, Department of Electrical Engineering, McGill University, Montreal, P.Q. H3A 2A8, Canada.
pp. 341-355
Ramesh Jain, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109.
Sandra L. Bartlett, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109.
Nancy O'Brien, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109.
pp. 356-369
Juyang Weng, Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801.
Thomas S. Huang, Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801.
Narendra Ahuja, Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801.
pp. 370-389
W. K. Gu, Department of Radio Engineering, Zhejiang University, Hangzhou, China.
J. Y. Yang, Department of Computer Science, East China Engineering Institute, Nanjing, China.
Thomas S. Huang, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
pp. 390-400
Radu Horaud, LIFIA, BP 68, 38402 Saint-Martin d'Hères, France.
pp. 401-412
Shi-Kuo Chang, Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616; Department of Computer Science, University of Pittsburgh, Pittsburgh, PA 152
Qing-Yun Shi, Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616; Department of Mathematics and the Information Science Center, Peking Univers
Cheng-Wen Yan, Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616; Department of Computer Science, University of Pittsburgh, Pittsburgh, PA 152
pp. 413-428
M. Dhome, Electronics Laboratory, University of Clermont II, Les Cezeaux, BP 45, 63170 Aubiere, France.
T. Kasvand, National Research Council of Canada, Ottawa, Ont. KIA OR6, Canada.
pp. 429-438
Bor-Dong Chen, Department of Electrical and Computer Engineering. Wayne State University, Detroit, MI 48202; Ford Motor Company, Dearborn, MI 48121.
Pepe Siy, Department of Electrical and Computer Engineering, Wayne State University, Detroit, MI 48202.
pp. 438-446
Vishvjit S. Nalwa, Artificial Intelligence Laboratory, Stanford University, CA 94305.
pp. 446-451
J. Koplowitz, Department of Electrical and Computer Engineering, Clarkson University, Potsdam, NY 13676.
A. P. Sundar Raj, Department of Electrical and Computer Engineering, Clarkson University, Potsdam, NY 13676.
pp. 451-457
H. M. Kalayeh, E. I. Du Pont de Nemours&Company, Wilmington, DE 19898.
D. A. Landgrebe, E. I. Du Pont de Nemours&Company, Wilmington, DE 19898.
pp. 457-461
L. A. Ferrari, Department of Radiological Sciences and Electrical Engineering, University of California, Irvine, CA 92717.
P. V. Sankar, Department of Radiological Sciences and Electrical Engineering, University of California, Irvine, CA 92717.
S. Shinnaka, National Defense Academy, Kanagawa-Ken, Japan.
J. Sklansky, Department of Radiological Sciences and Electrical Engineering, University of California, Irvine, CA 92717.
pp. 461-466
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