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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 1986 (vol. 8 no. 2)
ISSN: 0162-8828
Table of Contents
Papers
Demetri Terzopoulos, M.I.T Artificial Intelligence Laboratory, 545 Technology Square, Cambridge, MA 02139.
pp. 129-139
Catherine Garbay, Equipe de Reconnaissance des Formes et Microscopie Quantitative, Universite Scientifique et Medicale de Grenoble, 38402 Saint Martin D'Heres Cedex, France.
pp. 140-146
On Edge Detection (Abstract)
Vincent Torre, Department of Physics, University of Genoa, Genoa, Italy, 16146.
Tomaso A. Poggio, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 147-163
Wolfram H. H. J. Lunscher, Develcon Electronics Limited, Saskatoon, Canada.
Michael P. Beddoes, Department of Electrical Engineering, University of British Columbia, Vancouver, B.C., Canada V6T 1W5.
pp. 164-177
Wolfram H. H. J. Lunscher, Research and Development Division, Develcon Electronics Limited, Saskatoon. Canada.
Michael P. Beddoes, Department of Electrical Engineering, University of British Columbia, Vancouver, B.C., Canada V6T 1W5.
pp. 178-187
Sharon A. Stansfield, Department of Computer Science, University of Pennsylvania, Philadelphia, PA 19104.
pp. 188-199
John Canny, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 200-209
Michihiko Minoh, Department of Information Science, Kyoto University, Kyoto 606, Japan.
Toshiyuki Sakai, Department of Information Science, Kyoto University, Kyoto 606, Japan.
pp. 210-221
Stefano Alliney, Dipartimento di Matematica, Università di Bologna, Via Vallescura 2, 40126 Bologna, Italy.
Carlo Morandi, Dipartimento di Elettronica, Informatica e Sistemistica, Università di Bologna, Viale Risorgimento 2, 40136 Bologna, Italy; Dipartimento di Elettronica ed Automatica, Università di
pp. 222-233
William M. Wells, SRI International, Menlo Park, CA 94025.
pp. 234-239
Keinosuke Fukunaga, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Thomas E. Flick, Naval Research Laboratory, Washington, DC 20375.
pp. 240-247
Robert L. Cannon, Department of Computer Science, University of South Carolina, Columbia, SC 29208.
Jitendra V. Dave, IBM Palo Alto Scientific Center, Palo Alto, CA 94304.
James C. Bezdek, Department of Computer Science, University of South Carolina, Columbia, SC 29208.
pp. 248-255
Mandayam A. L. Thathachar, Department of Electrical Engineering, Indian Institute of Science, Bangalore 560012, India.
P. S. Sastry, Department of Electrical Engineering, Indian Institute of Science, Bangalore 560012, India.
pp. 256-268
Toshi Minami, Department of Electronic Engineering, Kogakuin University, Tokyo, 160, Japan.
Katsuyuki Shinohara, Department of Electronic Engineering, Kogakuin University, Tokyo, 160, Japan.
pp. 269-276
Leo Dorst, Department of Applied Physics, Delft University of Technology, 2628 CJ Delft, The Netherlands.
Arnold W. M. Smeulders, Department of Pathology and Medical Informatics, Free University, Amsterdam, The Netherlands.
pp. 276-282
Jorge L. Aravena, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
William A. Porter, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, LA 70803.
pp. 282-284
Shokri Z. Selim, Department of Systems Engineering, University of Petroleum and Minerals, Dhahran 31261, Saudi Arabia.
M. A. Ismail, School of Computer Science, University of Windsor, Windsor, Ont., Canada N9B 3P4.
pp. 284-288
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