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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1986 (vol. 8 no. 1)
ISSN: 0162-8828
Table of Contents
Papers
Haruo Asada, M.I.T. Artificial Intelligence Laboratory, 545 Technology Square, Cambridge, MA 02139.
Michael Brady, M.I.T. Artificial Intelligence Laboratory, 545 Technology Square, Cambridge, MA 02139; Department of Engineering Science, University of Oxford, Oxford, OX1 3PJ, England.
pp. 2-14
Alan L. Yuille, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
Tomaso A. Poggio, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 15-25
Jean Babaud, Schlumberger Computer Aided Systems, Palo Alto, CA 94304.
Andrew P. Witkin, Schlumberger Computer Aided Systems, Palo Alto, CA 94304.
Michel Baudin, Schlumberger Computer Aided Systems, Palo Alto, CA 94304.
Richard O. Duda, Syntelligence. Sunnyvale, CA.
pp. 26-33
Farzin Mokhtarian, Laboratory for Computational Vision, Department of Computer Science, University of British Columbia, Vancouver, B.C., V6T 1W5, Canada.
Alan Mackworth, Laboratory for Computational Vision, Department of Computer Science, University of British Columbia, Vancouver, B.C., V6T 1W5, Canada.
pp. 34-43
Nicholas Ayache, Computer Vision and Robotics Group, INRIA, 78153 Le Chesnay Cedex, France.
Olivier D. Faugeras, Computer Vision and Robotics Group, INRIA, 78153 Le Chesnay Cedex, France.
pp. 44-54
Susan R. Dubois, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139.
Filson H. Glanz, Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH 03824.
pp. 55-66
James George Dunham, Department of Electrical Engineering, Southern Methodist University, Dallas, TX 75275.
pp. 67-75
Felicia M. Vilnrotter, Hughes Artifical Intelligence Center, Calabasas, CA.
Ramakant Nevatia, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
Keith E. Price, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
pp. 76-89
Ted J. Broida, Hughes Aircraft Company, Radar Systems Group, Los Angeles, CA 90009.
Rama Chellappa, Department of Electrical Engineering¿Systems, Signal and Image Processing Institute, University of Southern California, Los Angeles, CA 90089.
pp. 90-99
Martin A. Fischler, SRI International, 333 Ravenswood Avenue. Menlo Park, CA 94025.
Robert C. Bolles, SRI International, 333 Ravenswood Avenue. Menlo Park, CA 94025.
pp. 100-105
E. S. Mc Vey, School of Engineering and Applied Sciences, University of Virginia, Charlottesville, VA 22901.
K. C. Drake, School of Engineering and Applied Sciences, University of Virginia, Charlottesville, VA 22901.
R. M. Inigo, School of Engineering and Applied Sciences, University of Virginia, Charlottesville, VA 22901.
pp. 105-109
Amar Mitiche, INRS-Telecommunications, Ile-des-Soeurs, P.Q., Canada; Image and Signal Analysis, University of Texas at Austin, Austin, TX 78712.
pp. 109-112
Hiroshi Nagahashi, Faculty of Engineering, Electronical Engineering, Yamagata University, Jyonan 4-3-16, Yonezawa-City, Yamagata 992, Japan.
Mikio Nakatsuyama, Faculty of Engineering, Electronical Engineering, Yamagata University, Jyonan 4-3-16, Yonezawa-City, Yamagata 992, Japan.
pp. 112-118
Michael Unser, Signal Processing Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland; Biomedical Engineering and Instrumentation Branch, National Institutes of Health, Bethes
pp. 118-125
Breaker Page (PDF)
pp. 127-128
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