Advanced Search 
IEEE Transactions on Pattern Analysis and Machine Intelligence
March 1985 (vol. 7 no. 3)
ISSN: 0162-8828
Table of Contents
Papers
Heinrich Niemann, Lehrstuhl für Informatik 5 (Mustererkennung), University Erlangen-Nürnberg, West Germany.
Horst Bunke, Lehrstuhl für Informatik 5 (Mustererkennung), University Erlangen-Nürnberg, West Germany.
Ingrid Hofmann, Lehrstuhl für Informatik 5 (Mustererkennung), University Erlangen-Nürnberg, West Germany.
Gerhard Sagerer, Lehrstuhl für Informatik 5 (Mustererkennung), University Erlangen-Nürnberg, West Germany.
Friedrich Wolf, Institut and Poliklinik für Nuklear-medizin, University Erlangen-Nürnberg, West Germany.
Herbert Feistel, Institut and Poliklinik für Nuklear-medizin, University Erlangen-Nürnberg, West Germany.
pp. 246-259
Henri Prade, Langages et Systemes Informatiques, Université Paul Sabatier, Toulouse Cedex France.
pp. 260-283
Yoav Cohen, National Institute for Testing and Evaluation, Jerusalem, Israel.
Michael S. Landy, Human Information Processing Laboratory, Department of Psychology, New York University, New York, NY 10003.
M. Pavel, Department of Psychology, Stanford University, Stanford, CA 94305.
pp. 284-298
Yao-Chou Cheng, Exxon Production Research Company, Houston, TX 77001.
Shin-Yee Lu, Exxon Production Research Company, Houston, TX 77001.
pp. 299-305
Heng-Da Cheng, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Wei-Chung Lin, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
King-Sun Fu, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 306-319
David G. Lowe, Stanford Artificial Intelligence Laboratory, Stanford University, Stanford, CA 94305; Courant Institute of Mathematical Sciences, New York University, New York, NY 10012.
Thomas O. Binford, Stanford Artificial Intelligence Laboratory, Stanford University, Stanford, CA 94305.
pp. 320-326
Lawrence O'Gorman, Carnegie-Mellon University, Pittsburgh, PA 15213; AT&T Bell Laboratories, Murray Hill, NJ 07974.
Arthur C. Sanderson, Robotics Institute and the Department of Electrical and Computer Engineering, Carnegie-Mellon University, Pittsburgh, PA 15213.
pp. 326-332
K. P. Lam, Division of Electrical Engineering, National Research Council of Canada, Ottawa, Ont., Canada K1A 0R8.
pp. 332-338
Ardeshir Goshtasby, Department of Computer Science, University of Kentucky, Lexington, KY 40506.
pp. 338-344
David M. Mark, Visiting Scientist, CSIRO Division of Computing Research; Department of Geography, State University of New York, Buffalo, NY 14260.
David J. Abel, CSIRO Division of Computing Research, Davies Laboratory, Queensland 4814, Australia.
pp. 344-349
Fred W. M. Stentiford, British Telecom Research Laboratories. Ipswich, Suffolk, England.
pp. 349-355
Alfred M. Bruckstein, Department of Electrical Engineering, Stanford University, Stanford, CA 94305.
Thomas M. Cover, Department of Electrical Engineering and Statistics, Stanford University, Stanford, CA 94305.
pp. 355-358
G. S. Stiles, Department of Electrical Engineering, Utah State University, Logan, UT 84322; Department of Electrical and Computer Engineering, Syracuse University, Syracuse, NY 13210.
Dong-Lih Denq, Department of Electrical Engineering, Utah State University, Logan, UT 84322.
pp. 358-360
Luc Devroye, School of Computer Science, McGill University, Montreal, P.Q., Canada.
Fred Machell, Applied Research Laboratories, University of Texas, Austin, TX 78713.
pp. 360-366
Tao Gu, University of Technology of Compiegne, 60206 Compiegne Cedex, France.
B. Dubuisson, University of Technology of Compiegne, 60206 Compiegne Cedex, France.
pp. 366-372
Usage of this product signifies your acceptance of the Terms of Use.