CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1985 vol.7 Issue No.01 - January
Issue No.01 - January (1985 vol.7)
Linda G. Shapiro , Machine Vision International, Ann Arbor, MI 48104.
Robert M. Haralick , Machine Vision International, Ann Arbor, MI 48104.
Relational models are frequently used in high-level computer vision. Finding a correspondence between a relational model and an image description is an important operation in the analysis of scenes. In this paper the process of finding the correspondence is formalized by defining a general relational distance measure that computes a numeric distance between any two relational descriptions-a model and an image description, two models, or two image descriptions. The distance measure is proved to be a metric, and is illustrated with examples of distance between object models. A variant measure used in our past studies is shown not to be a metric.
Linda G. Shapiro, Robert M. Haralick, "A Metric for Comparing Relational Descriptions", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.7, no. 1, pp. 90-94, January 1985, doi:10.1109/TPAMI.1985.4767621