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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 1983 (vol. 5 no. 2)
ISSN: 0162-8828
Table of Contents
Papers
R. A. Jarvis, Department of Computer Science, Australian National University, Canberra, Australia.
pp. 122-139
Rodney A. Brooks, Stanford Artificial Intelligence Laboratory, Stanford University, Stanford, CA 94305; Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139
pp. 140-150
Worthy N. Martin, MEMBER, IEEE, Laboratory for Image and Signal Analysis, University of Texas, Austin, TX 78712; Department of Applied Mathematics and Computer Sciences, University of Virginia, Char
J. K. Aggarwal, FELLOW, IEEE, Laboratory for Image and Signal Analysis, University of Texas, Austin, TX 78712.
pp. 150-158
Roger Y. Tsai, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
pp. 159-174
Amar Mitiche, Department of Electrical Engineering and the Laboratory for Image and Signal Analysis, University of Texas, Austin, TX 78712; Institut National de la Recherche Scientifique, Verdun
J. K. Aggarwal, Department of Electrical Engineering and the Laboratory for Image and Signal Analysis, University of Texas, Austin, TX 78712.
pp. 174-178
Lalit R. Bahl, MEMBER, IEEE, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
Frederick Jelinek, FELLOW, IEEE, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
Robert L. Mercer, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598.
pp. 179-190
Philip E. Zwicke, MEMBER, IEEE, United Technologies Research Center, East Hart-ford, CT 06108.
Imre Kiss, Norden Systems, Norwalk, CT 06856; United Technologies Research Center, East Hartford, CT 06108.
pp. 191-199
George Nagy, Department of Computer Science, University of Nebraska, Lincoln, NE 68588.
pp. 199-205
V. N. Dvornychenko, Ford Aerospace and Communications Corporation, Newport Beach, CA 92660; Electro-Mechanical Division, Northrop Corporation, Anaheim, CA 92801.
pp. 206-213
Krishna K. Agarwal, Department of Computing and Information Science, Trinity University, San Antonio, TX 78284.
pp. 213-217
Sasa Presern, Jozef Stefan Institute, Jamova 39, Ljubljana, Yugoslavia.
Ludvik Gyergyek, Jozef Stefan Institute, Jamova 39, Ljubljana, Yugoslavia.
pp. 217-220
Eric Backer, Department of Electrical Engineering, Delft University of Technology, Delft, The Netherlands.
H. P. A. Haas, Department of Electrical Engineering, Delft University of Technology, Delft, The Netherlands.
R. Getreuer, Department of Electrical Engineering, Delft University of Technology, Delft, The Netherlands.
pp. 220-224
Moshe Ben-Bassat, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90039; Faculty of Management,
David B. Campell, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90039.
Arthur R. Macneil, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90039.
Max Harry Weil, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90039.
pp. 225-229
K. K. Paliwal, Speech and Digital Systems Group, Tata Institute of Fundamental Research, Bombay 400005, India.
P. V. S. Rao, Speech and Digital Systems Group, Tata Institute of Fundamental Research, Bombay 400005, India.
pp. 229-231
Chul E. Kim, Department of Computer Science, Washington State University, Pullman, WA 99164.
pp. 231-234
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