Advanced Search 
IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1983 (vol. 5 no. 1)
ISSN: 0162-8828
Table of Contents
Papers
Clifford C. Geschke, Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801; Unimation, Inc., Hacienda Heights, CA 91745.
pp. 1-7
C. W. K. Gritton, MEMBER, IEEE, Department of Electrical Engineering, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901; Bell Laboratories, Holmdel, NJ 077
Edward A. Parrish, SENIOR MEMBER, IEEE, Department of Electrical Engineering, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
pp. 8-13
Philip Lavin, Division of Biostatistics and Epidemiology, Sidney Farber Cancer Institute, Boston, MA 02115; Department of Biostatistics, Harvard School of Public Health, Boston, MA 02115.
pp. 14-24
George R. Cross, MEMBER, IEEE, Department of Computer Science, Louisiana State University, Baton Rouge, LA 70803.
Anil K. Jain, MEMBER, IEEE, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
pp. 25-39
Glenn W. Milligan, Faculty of Management Sciences, Ohio State University, Columbus, OH 43210.
S. C. Soon, College of Administrative Sciences, Ohio State University, Columbus, OH 43210.
Lisa M. Sokol, Flight Systems, Inc., Arlington, VA 22209.
pp. 40-47
Alan H. Feiveson, NASA Johnson Space Center, Houston, TX 77058.
pp. 48-54
Kendall Preston, Department of Electrical Engineering, Carnegie-Mellon University, Pittsburgh, PA 15213; Department of Radiation Health, University of Pittsburgh, Pittsburgh, PA 15213.
pp. 55-58
Ramesh Jain, Intelligent Systems Laboratory, Department of Computer Science, Wayne State University, Detroit, MI 48202; Department of Electrical and Computer Engineering, University of Michigan
pp. 58-64
Patrick C. Chen, Exxon Production Research Company, Houston, TX 77001.
Theodosios Pavlidis, Bell Laboratories, Murray Hill, NJ 07794.
pp. 64-69
Sankar K. Pal, Electronics and Communication Sciences Unit, Indian Statistical Institute, Calcutta, India; Department of Electrical Engineering, Imperial College of Science and Technology, London
Robert A. King, Department of Electrical Engineering, Imperial College of Science and Technology, London, England.
pp. 69-77
William I. Grosky, Intelligent Systems Laboratory, Department of Computer Science, Wayne State University, Detroit, MI 48202.
Ramesh Jain, Intelligent Systems Laboratory, Department of Computer Science, Wayne State University, Detroit, MI 48202; Department of Electrical and Computer Engineering, University of Michigan
pp. 77-83
Y. X. Gu, Department of Computer Science, Concordia University, Montreal, P.Q., H3G 1M8, Canada.
Q. R. Wang, Department of Computer Science, Concordia University, Montreal, P.Q., H3G 1M8, Canada.
C. Y. Suen, Department of Computer Science, Concordia University, Montreal, P.Q., H3G 1M8, Canada.
pp. 83-89
Raphael A. Finkel, Department of Computer Sciences, University of Wisconsin, Madison, WI 53706.
John P. Fishburn, Bell Laboratories, Murray Hill, NJ 07974.
pp. 89-92
Giacomo Della Riccia, Ben-Gurion University of the Negev, Beer-Sheva, Israel; Istituto di Matematica, Universita di Udine, 33100 Udine, Italy.
Alexander Shapiro, Ben-Gurion University of the Negev, Beer-Sheva, Israel; Department of Statistics and Operations Research, University of South Africa, 0001 Pretoria, South Africa.
pp. 99-104
John Fairfield, Department of Mathematics and Computer Science, James Madison University, Harrisonburg, VA 22807.
pp. 104-110
Roger Mohr, Unite d'Enseignement et de Recherche Sciences Mathematiques, Université de Nancy, Nancy, France.
Ruzena Bajcsy, Department of Computer and Information Science, University of Pennsylvania, Philadelphia, PA 19104.
pp. 111-116
Breaker Page (PDF)
pp. 117-118
Usage of this product signifies your acceptance of the Terms of Use.