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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 1982 (vol. 4 no. 6)
ISSN: 0162-8828
Table of Contents
Papers
Roland T. Chin, MEMBER, IEEE, Department ot Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706.
Charles A. Harlow, MEMBER, IEEE, Department of Electrical Engineering, College of Engineering, Louisiana State University, Baton Rouge, LA 70803.
pp. 557-573
Horst Bunke, Lehrstuhl fuer Informatik 5, University of Erlangen, Erlangen, West Germany.
pp. 574-582
George R. Legters, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124; Institute for Acoustical Research, Miami, FL 33130.
Tzay Y. Young, SENIOR MEMBER, IEEE, Department of Ellectrical Engineering, University of Miami, Coral Gables, FL 33124.
pp. 583-594
Linda G. Shapiro, SENIOR MEMBER, IEEE, Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
Robert M. Haralick, SENIOR MEMBER, IEEE, Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
pp. 595-602
Jean-Daniel Boissonnat, Institut National d'Informatique et d'Automatique (INRIA), 78153 Le Chesnay Cédex, France.
pp. 603-612
Chul E. Kim, Department of Computer Science, University of Maryland, College Park, MD 20742; Department of Computer Science, Washington State University, Pullman, WA 99164.
Azriel Rosenfeld, FELLOW, IEEE, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 612-618
Chul E. Kim, Department of Computer Science, University of Maryland, College Park, MD 20742; Department of Computer Science, Washington State University, Pullman, WA 99163.
pp. 618-626
Takeshi Agui, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Midori-ku, Yokohama 227, Japan.
Toru Yamanouchi, STUDENT MEMBER, IEEE, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Midori-ku, Yokohama 227, Japan.
Masayuki Nakajima, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Midori-ku, Yokohama 227, Japan.
pp. 627-634
Takeshi Agui, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuda-cho, Midori-ku, Yokohama 227, Japan.
Masayuki Nakajima, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuda-cho, Midori-ku, Yokohama 227, Japan.
Yukihiro Arai, Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuda-cho, Midori-ku, Yokohama 227, Japan.
pp. 635-641
Yukio Sato, Department of Electronic Engineering, Tokyo University of Agriculture&Technology, Koganei, Tokyo, Japan.
Hiroo Kitagawa, Department of Electric Engineering, Keio University, Kohoku, Yokohama, Japan.
Hiroichi Fujita, Department of Electric Engineering, Keio University, Kohoku, Yokohama, Japan.
pp. 641-646
Eugene S. Mcvey, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
Jong W. Lee, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
pp. 646-649
R. L. Kashyap, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
B. J. Oommen, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Department of Computer Science, Carleton University, Ottowa, Ont., Canada K1S 586.
pp. 649-654
Radmilo Bozinovic, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
Sargur N. Srihari, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
pp. 655-663
J.-G. Postaire, Centre d'Automatique, University of Lille 1, 59655 Villeneuve d'Ascq Cedex, France; Faculty of Sciences, University Mohamed V, B. P. 1014, Rabat, Morocco.
C. Vasseur, Centre d'Automatique, University of Lille 1, 59655 Villeneuve d'Ascq Cedex, France.
pp. 663-666
Andrzej Giryn, Merchang Navy Academy, 81-962 Gdynia, ul. Czerwonych Kosynierow 83, Poland.
pp. 666-671
Seymour Shlien, Department of Communications, Communications Research Center, Box 11490, Station H, Ottawa, Ont., Canada K2H 8S2.
pp. 671-676
Stephen A. Kuschel, Radar and Optics Division, Environmental Research Institute of Michigan, Ann Arbor, MI 48107.
Carl V. Page, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
pp. 676-682
A. K. Datta, Electronics and Communication Sciences Unit, Indian Statistical Institute, Calcutta 700035, India.
N. R. Ganguli, Electronics and Communication Sciences Unit, Indian Statistical Institute, Calcutta 700035, India.
S. Ray, Electronics and Communication Sciences Unit, Indian Statistical Institute, Calcutta 700035, India.
pp. 683-689
Bir Bhanu, Aeronutronic Division, Ford Aerospace and Communications Corporation, Newport Beach, CA 92660.
Olivier D. Faugeras, INRIA, Rocquencourt, France; University of Paris XI, Paris, France.
pp. 689
Index Edics (PDF)
pp. 690-697
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