CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1982 vol.4 Issue No.06 - June
Issue No.06 - June (1982 vol.4)
Yukio Sato , Department of Electronic Engineering, Tokyo University of Agriculture&Technology, Koganei, Tokyo, Japan.
Hiroo Kitagawa , Department of Electric Engineering, Keio University, Kohoku, Yokohama, Japan.
Hiroichi Fujita , Department of Electric Engineering, Keio University, Kohoku, Yokohama, Japan.
A method for the shape measurement of curved objects has been developed using multiple slit-ray projections and a turntable. The object is placed on a computer-controlled turntable and irradiated by two directed slit-ray projectors. An ITV camera takes a line image of the reflection from the object, and a computer calculates the space coordinates of the object surface. By using multiple projections, the total shape measurement of the object surface is attained accurately.
Yukio Sato, Hiroo Kitagawa, Hiroichi Fujita, "Shape Measurement of Curved Objects Using Multiple Slit-Ray Projections", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.4, no. 6, pp. 641-646, June 1982, doi:10.1109/TPAMI.1982.4767318