CSDL Home IEEE Transactions on Pattern Analysis & Machine Intelligence 1982 vol.4 Issue No.06 - June
Issue No.06 - June (1982 vol.4)
Roland T. Chin , MEMBER, IEEE, Department ot Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706.
This paper surveys publications, reports, and articles dealing with automated visual inspection for industry. The references are organized according to their contents: overview and discussions, rationales, components and design considerations, commercially available systems, applications. A number of applications and their inspection methodologies are discussed in detail: the inspection of printed circuit boards, photomasks, integrated circuit chips. Other inspection applications are listed as a bibliography. A list of selectively annotated references in commercially available visual inspection tools is also included.
Roland T. Chin, "Automated Visual Inspection: A Survey", IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.4, no. 6, pp. 557-573, June 1982, doi:10.1109/TPAMI.1982.4767309