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IEEE Transactions on Pattern Analysis and Machine Intelligence
May 1982 (vol. 4 no. 5)
ISSN: 0162-8828
Table of Contents
Papers
Kokichi Sugihara, Faculty of Engineering, Department of Information Science, Nagoya University, Fur¿-ch¿, Chikusa-ku, Nagoya, Japan.
pp. 458-469
Layne T. Watson, Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
Linda G. Shapiro, SENIOR MEMBER, IEEE, Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
pp. 469-475
Ramakant Nevatia, MEMBER, IEEE, Departments of Electrical Engineering and Computer Science, University of Southern California, Los Angeles, CA 90089.
Keith E. Price, MEMBER, IEEE, Department of Electrical Engineering Systems and the Image Processing Institute, University of Southern California, Los Angeles, CA 90089.
pp. 476-484
Edward J. Wegman, SENIOR MEMBER, IEEE, Statistics and Probability Program, Office of Naval Research, Arlington, VA 22217.
Jerren Gould, Hughes Aircraft Company, Fullerton, CA.
pp. 485-492
Benjamin Kedem, Department of Mathematics, University of Maryland, College Park, MD 20742.
pp. 493-499
Arthur J. Nevins, Department of Information Systems, Georgia State University, Atlanta, GA 30303.
pp. 500-511
Hiroyasu Murakami, Research and Development Section, Yanagicho Works, Toshiba Corporation, Kawasaki, Japan.
B. V. K. Vijaya Kumar, Department of Electrical Engineering, Carnegie-Mellon University, Pittsburgh, PA 15213.
pp. 511-515
I. L. Ayala, Rockwell International, Anaheim, CA 92803; Vitro Tec, Grupo Vidrio, Monterey, N. L., Mexico.
D. A. Orton, Rockwell International, Anaheim, CA 92803.
J. B. Larson, Rockwell International, Anaheim, CA 92803.
D. F. Elliott, Rockwell International, Anaheim, CA 92803.
pp. 515-520
Jonathan J. Hull, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
Sargur N. Srihari, Department of Computer Science, State University of New York at Buffalo, Amherst, NY 14226.
pp. 520-530
Roger Peck, Programs in Mathematical Sciences, University of Texas at Dallas, Richardson, TX 75080.
John Van Ness, Programs in Mathematical Sciences, University of Texas at Dallas, Richardson, TX 75080.
pp. 530-537
D. F. Mix, Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701.
R. A. Jones, Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701.
pp. 537-544
J. R. Ullmann, Department of Computer Science, The University, Sheffield, England.
pp. 544-551
Zhong-De Wang, Department of Electrical Engineering, University of Arizona, Tucson, AZ 85721; Kunming Physics Research Institute, China.
pp. 551-555
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