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Two New Edge Detectors
May 1981 (vol. 3 no. 5)
pp. 581-592
Charles J. Jacobus, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Texas Instruments, Inc., Dallas, TX 75265.
Robert T. Chien, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
This paper introduces two new edge detection algorithms. One uses multiple difference-based edge detectors. This scheme selects peak center by absolute maximum or center of mass techniques. The other algorithm is motivated by the observation that second-order enhancement improves human contour extraction, but generally confuses difference-based edge detectors. This algorithm translates intensity images into three state images (plus one, zero, and minus one), then uses multiple three-state edge masks to find edge positions. The second scheme has a multiple hardware implementation and interesting biological analogs. Finally, the two operators introduced are compared to some popular edge detection techniques from the literature.
Citation:
Charles J. Jacobus, Robert T. Chien, "Two New Edge Detectors," IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 3, no. 5, pp. 581-592, May 1981, doi:10.1109/TPAMI.1981.4767149
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