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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 1981 (vol. 3 no. 2)
ISSN: 0162-8828
Table of Contents
Papers
Steven W. Zucker, MEMBER, IEEE, Department of Electrical Engineering, Computer Vision and Graphics Laboratory, McGill University, Montreal, P.Q., Canada.
Yvan G. Leclerc, MEMBER, IEEE, Department of Electrical Engineering, Computer Vision and Graphics Laboratory, McGill University, Montreal, P.Q., Canada.
John L. Mohammed, MEMBER, IEEE, Department of Electrical Engineering, Computer Vision and Graphics Laboratory, McGill University, Montreal, P.Q., Canada.
pp. 117-127
Robert E. Bogner, Department of Electrical Engineering, University of Adelaide, Adelaide, Australia.
pp. 128-133
Carlo Arcelli, Laboratorio di Cibernetica, C. N. R., Naples, Italy.
Luigi P. Cordella, MEMBER, IEEE, Laboratorio di Cibernetica, C. N. R., Naples, Italy.
Stefano Levialdi, MEMBER, IEEE, Laboratorio di Cibernetica, C. N. R., Naples, Italy.
pp. 134-143
Carolyn M. Bjorklund, MEMBER, IEEE, Lockheed Palo Alto Research Laboratory, Palo Alto, CA 94304.
Theodosios Pavlidis, FELLOW, IEEE, Bell Laboratories, Murray Hill, NJ 07974.
pp. 144-155
Tzay Y. Young, SENIOR MEMBER, IEEE, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124.
Philip S. Liu, MEMBER, IEEE, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124.
Romulo J. Rondon, Department of Electrical Engineering, University of Miami, Coral Gables, FL 33124; Engineering Department, Ford Motor de Venezuela, Valencia, Venezuela.
pp. 155-163
Jack-Gerard Postaire, MEMBER, IEEE, Laboratoire d'Electronique et d'Etude des Systemes Automatiques, Faculté des Sciences, Rabat, Morocco.
Christian P. A. Vasseur, Centre d'Automatique, Université de Lille, Villeneuve d'Ascq, Cedex, France.
pp. 163-179
Jack Koplowitz, SENIOR MEMBER, IEEE, Department of Electrical and Computer Engineering, Clarkson College of Technology, Potsdam, NY 13676.
pp. 180-185
Stanley R. Deans, School of Mathematics, University of Minnesota, Minneapolis, MN 55455.
pp. 185-188
J. A. Richards, School of Electrical Engineering and the Laboratory for Applications of Remote Sensing, Purdue University, West Lafayette, IN 47907; School of Electrical Engineering, University of
D. A. Landgrebe, School of Electrical Engineering and the Laboratory for Applications of Remote Sensing, Purdue University, West Lafayette, IN 47907.
P. H. Swain, School of Electrical Engineering and the Laboratory for Applications of Remote Sensing, Purdue University, West Lafayette, IN 47907.
pp. 188-191
Stephen Y. Itoga, Department of Information and Computer Science, University of Hawaii, Honolulu, HI 96822.
pp. 191-197
Gerald J. Agin, Robotics Institute, Carnegie-Mellon University, Pittsburgh, PA 15213.
pp. 197-204
A. Barrero, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
R. C. Gonzalez, Department of Electrical Engineering, University of Tennessee, Knoxville, TN 37916.
M. G. Thomason, Department of Computer Science, University of Tennessee, Knoxville, TN 37916.
pp. 204-206
Stanley L. Sclove, Department of Mathematics, University of Illinois at Chicago Circle, Chicago, IL 60680.
pp. 206-208
Shmuel Peleg, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
Azriel Rosenfeld, Computer Vision Laboratory, Computer Science Center, University of Maryland, College Park, MD 20742.
pp. 208-210
Kenji Murakami, Department of Electronics Engineering, Ehime University, Matsuyama, Japan.
Tsunehiro Aibara, Department of Electronics Engineering, Ehime University, Matsuyama, Japan.
pp. 210-214
L. S. Davis, Department of Computer Sciences, University of Texas at Austin, Austin, TX 78712.
M. Clearman, Department of Computer Sciences, University of Texas at Austin, Austin, TX 78712.
J. K. Aggarwal, Department of Electrical Engineering, University of Texas at Austin, Austin, TX 78712.
pp. 214-221
Shuzo Yajima, Department of Information Science, Faculty of Engineering, Kyoto University, Kyoto, Japan.
Jan L. Goodsell, Department of Information Science, Faculty of Engineering, Kyoto University, Kyoto, Japan; Department of Electrical Engineering, Stanford University, Stanford, CA 94305; Amdahl Cor
Takao Ichida, Department of Information Science, Faculty of Engineering, Kyoto University, Kyoto, Japan.
Hiromi Hiraishi, Department of Information Science, Faculty of Engineering, Kyoto University, Kyoto, Japan.
pp. 221-230
R. M. Inigo, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
E. S. Mcvey, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
pp. 230-240
S. S. Reddi, Aeronutronic Division, Aerospace and Communication Corporation, Newport Beach, CA 92663.
pp. 240-242
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