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IEEE Transactions on Pattern Analysis and Machine Intelligence
March 1980 (vol. 2 no. 3)
ISSN: 0162-8828
Table of Contents
Papers
Robert M. Haralick, SENIOR MEMBER, IEEE, Departments of Electrical Engineering and Computer Science, University of Kansas, Lawrence, KS 66045; Department of Electrical Engineering, Virginia Polytechni
Linda G. Shapiro, Department of Computer Science, Kansas State University, Manhattan, KS 66506; Department of Computer Science, Virginia Polytechnic Institute and State University, Blacksburg, VA 24
pp. 193-203
Richard W. Conners, MEMBER, IEEE, Department of Electrical Engineering, College of Engineering, Louisiana State University, Baton Rouge, LA 70803.
Charles A. Harlow, MEMBER, IEEE, Department of Electrical Engineering, College of Engineering, Louisiana State University, Baton Rouge, LA 70803.
pp. 204-222
Kameswara Rao, Department of Electrical Engineering, University of Linköping, Linköping, Sweden.
Kenneth Balck, Department of Electrical Engineering, University of Linköping, Linköping, Sweden.
pp. 223-231
Anil K. Jain, MEMBER IEEE, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Stephen P. Smith, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Eric Backer, Laboratory for Information Theory, Delft University of Technology, Delft, The Netherlands.
pp. 232-242
Sarunas Raudys, Lietuvos RSR Moksly, Adademiha, Lenino, U.S.S.R.
Vitalijus Pikelis, Lietuvos RSR Moksly, Adademiha, Lenino, U.S.S.R.
pp. 242-252
Alan J. Filipski, Department of Mathematics, Arizona State University, Tempe, AZ 85281.
pp. 252-255
Dimitri Kazakos, Department of Electrical Engineering, State University of New York at Buffalo, Amherst, NY 14260.
pp. 255-258
J. Kittler, Image Analysis Group, Nuclear Physics Laboratory, Oxford University, Oxford, England.
P. A. Devijver, Philips Research Laboratory, Brussels, Belgium.
pp. 259-261
Moshe Ben-Bassat, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027; Faculty of Management,
Karin L. Klove, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
Max H. Weil, Institute of Critical Care Medicine and the Division of Critical Care Medicine, University of Southern California School of Medicine, Los Angeles, CA 90027.
pp. 261-266
Wesley E. Snyder, Image Analysis Group, Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27607.
D. Allen Tang, Image Analysis Group, Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27607.
pp. 266-269
Chang Eun Kim, Department of Electrical Engineering, University of Pittsburgh, Pittsburgh, PA 15261.
Michael G. Strintzis, Department of Electrical Engineering, University of Pittsburgh, Pittsburgh, PA 15261.
pp. 269-273
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