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IEEE Transactions on Knowledge and Data Engineering
October 2010 (vol. 22 no. 10)
ISSN: 1041-4347
Table of Contents
REGULAR PAPERS
Sinno Jialin Pan, Hong Kong University of Science and Technology, Hong Kong
Qiang Yang, Hong Kong University of Science and Technology, Hong Kong
pp. 1345-1359
Shady Shehata, University of Waterloo, Waterloo
Fakhri Karray, University of Waterloo, Waterloo
Mohamed S. Kamel, University of Waterloo, Waterloo
pp. 1360-1371
Xiangmin Zhou, Canberra ICT Center, CSIRO, Australia
Xiaofang Zhou, The University of Queensland, Brisbane
Lei Chen, Hong Kong University of Science and Technology, Hong Kong
Yanfeng Shu, Tasmanian ICT Center, CSIRO, Australia
Athman Bouguettaya, Canberra ICT Center, CSIRO, Australia
John A. Taylor, Canberra CMIS Center, CSIRO, Australia
pp. 1372-1387
Mike Wasikowski, United States Army Traning and Doctrine Command Analysis Center, Fort Leavenworth
Xue-wen Chen, The University of Kansas, Lawrence
pp. 1388-1400
Liang Wang, The University of Melbourne, Melbourne
Xin Geng, Southeast University, Nanjing
James Bezdek, The University of Melbourne, Melbourne
Christopher Leckie, The University of Melbourne, Melbourne
Kotagiri Ramamohanarao, The University of Melbourne, Melbourne
pp. 1401-1414
L. Venkata Subramaniam, IBM India Research Laboratory, New Delhi
Amit Anil Nanavati, IBM India Research Laboratory, New Delhi
Sougata Mukherjea, IBM India Research Laboratory, New Delhi
pp. 1415-1427
Sergio Consoli, Brunel University, Uxbridge
Kenneth Darby-Dowman, Brunel University, Uxbridge, Middlesex
Gijs Geleijnse, Philips Research Eindhoven, Eindhoven
Jan Korst, Philips Research Eindhoven, Eindhoven
Steffen Pauws, Philips Research Eindhoven, Eindhoven
pp. 1428-1443
Ken C.K. Lee, The Pennsylvania State University, University Park
Wang-Chien Lee, The Pennsylvania State University, University Park
Hong Va Leong, The Hong Kong Polytechnic University, Hong Kong
pp. 1444-1458
Yanhua Chen, Wayne State University, Detroit
Lijun Wang, Wayne State University, Detroit
Ming Dong, Wayne State University, Detroit
pp. 1459-1474
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