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IEEE Transactions on Knowledge and Data Engineering
May 2010 (vol. 22 no. 5)
ISSN: 1041-4347
Table of Contents
REGULAR PAPERS
Viviana Mascardi, Università Studi di Genova, Genova
Angela Locoro, Università Studi di Genova, Genova
Paolo Rosso, Universidad Politécnica de Valencia, Valencia
pp. 609-623
Suyun Zhao, Hong Kong Polytechnic University, Hong Kong and Hebei University, Baoding
Eric C.C. Tsang, Hong Kong Polytechnic University, Hong Kong
Degang Chen, North China Electric Power University, Beijing
XiZhao Wang, Hebei University, Baoding
pp. 624-638
Chunyu Yang, Tsinghua University, Beijing
Yong Cao, Microsoft Research Asia, Beijing
Zaiqing Nie, Microsoft Research Asia, Beijing
Jie Zhou, Tsinghua University, Beijing
Ji-Rong Wen, Microsoft Research Asia, Beijing
pp. 639-650
Deke Guo, National University of Defense Technology, Changsha
Yunhao Liu, Hong Kong University of Science and Technolgy, Hong Kong
Xiangyang Li, Hangzhou Dianzi University, Hangzhou and Illinois Institute of Technology, Chicago
Panlong Yang, P.L.A. University of Science and Technology, Nanjing
pp. 651-664
Sarana Nutanong, The University of Melbourne, Victoria
Egemen Tanin, The University of Melbourne and NICTA Victoria Laboratory, Victoria
Rui Zhang, The University of Melbourne, Victoria
pp. 665-681
Ramadhana Bramandia, Nanyang Technological University, Singapore
Byron Choi, Hong Kong Baptist University, Hong Kong
Wee Keong Ng, Nanyang Technological University, Singapore
pp. 682-698
Mo Li, Hong Kong University of Science and Technology, Hong Kong
Yunhao Liu, Hong Kong University of Science and Technology, Hong Kong
pp. 699-710
Tao-Yang Fu, National Chiao Tung University, Hsinchu
Wen-Chih Peng, National Chiao Tung University, Hsinchu
Wang-Chien Lee, Pennsylvania State University, Pennsylvania
pp. 711-729
Leandro L. Minku, University of Birmingham, Birmingham
Allan P. White, University of Birmingham, Birmingham
Xin Yao, University of Birmingham, Birmingham
pp. 730-742
CONCISE PAPERS
Anton Dries, Katholieke Universiteit Leuven, Leuven
Luc De Raedt, Katholieke Universiteit Leuven, Leuven
Siegfried Nijssen, Katholieke Universiteit Leuven, Leuven
pp. 743-748
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