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| X. Kong, D. Klappholz, K. Psarris, "The I Test: An Improved Dependence Test for Automatic Parallelization and Vectorization," IEEE Transactions on Parallel and Distributed Systems, vol. 2, no. 3, pp. 342-349, July, 1991. | |||
| BibTex | x | ||
| @article{ 10.1109/71.86109, author = {X. Kong and D. Klappholz and K. Psarris}, title = {The I Test: An Improved Dependence Test for Automatic Parallelization and Vectorization}, journal ={IEEE Transactions on Parallel and Distributed Systems}, volume = {2}, number = {3}, issn = {1045-9219}, year = {1991}, pages = {342-349}, doi = {http://doi.ieeecomputersociety.org/10.1109/71.86109}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Parallel and Distributed Systems TI - The I Test: An Improved Dependence Test for Automatic Parallelization and Vectorization IS - 3 SN - 1045-9219 SP342 EP349 EPD - 342-349 A1 - X. Kong, A1 - D. Klappholz, A1 - K. Psarris, PY - 1991 KW - Index Termsautomatic parallelization; vectorization; I test; subscript dependence test; GCD; Banerjee tests; loops; loop iterations; parallel programming; program compilers; program testing VL - 2 JA - IEEE Transactions on Parallel and Distributed Systems ER - | |||
The I test is a subscript dependence test which extends both the range of applicability and the accuracy of the GCD and Banerjee tests (U. Banerjee, 1976), standard subscript dependence tests used to determine whether loops may be parallelized/vectorized. It is shown that the I test is useful when, in the event that a positive result must be reported, a definitive positive is of more use than a tentative positive and when insufficient loop iterations are known for the Banerjee test to apply.
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