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Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design
Dec. 2013 (vol. 62 no. 12)
pp. 2503-2515
Yuan-Hao Chang, Academia Sinica, Taipei
Po-Chun Huang, National Taiwan University, Taipei
Pei-Han Hsu, National Taiwan University, Taipei
Lue-Jane Lee, National Taiwan University, Taipei
Tei-Wei Kuo, National Taiwan University , Taipei
David Hung-Chang Du, University of Minnesota, Minneapolis
In recent years, reliability has become one critical issue in the designs of flash-memory file/storage systems, due to the growing unreliability of advanced flash-memory chips. In this paper, a version-based design is proposed to effectively and efficiently maintain the consistency among page versions of a file for potential recovery needs. In particular, a two-version one for a native file system is presented with the minimal overheads in version maintenance. A recovery scheme is then presented to restore a corrupted file back to the latest consistent version. The design is later extended to maintain multiple data versions with the considerations of the write constraints of multilevel-cell flash memory. It was shown that the proposed design could significantly improve the reliability of flash memory with limited management and space overheads.
Index Terms:
Storage management,Error correction codes,Flash memory,Reliability engineering,Computer architecture,Queueing analysis,queue,Flash memory,ECC,Poisson distribution,binomial distribution,file system,MLC,YAFFS,forward copying,recovery,reliability,two version
Yuan-Hao Chang, Po-Chun Huang, Pei-Han Hsu, Lue-Jane Lee, Tei-Wei Kuo, David Hung-Chang Du, "Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design," IEEE Transactions on Computers, vol. 62, no. 12, pp. 2503-2515, Dec. 2013, doi:10.1109/TC.2012.131
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