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BAGC: Buffer-Aware Garbage Collection for Flash-Based Storage Systems
Nov. 2013 (vol. 62 no. 11)
pp. 2141-2154
Sungjin Lee, Massachusetts Institute of Technology, Cambridge, MA
Dongkun Shin, Sungkyunkwan University, Suwon
Jihong Kim, Seoul National University, Seoul
NAND flash-based storage device is becoming a viable storage solution for mobile and desktop systems. Because of the erase-before-write nature, flash-based storage devices require garbage collection that causes significant performance degradation, incurring a large number of page migrations and block erasures. To improve I/O performance, therefore, it is important to develop an efficient garbage collection algorithm. In this paper, we propose a novel garbage collection technique, called buffer-aware garbage collection (BAGC), for flash-based storage devices. The BAGC improves the efficiency of two main steps of garbage collection, a block merge step and a victim block selection step, by taking account of the contents of a buffer cache, which is typically used to enhance I/O performance. The buffer-aware block merge (BABM) scheme eliminates unnecessary page migrations by evicting dirty data from a buffer cache during a block merge step. The buffer-aware victim block selection (BAVBS) scheme, on the other hand, selects a victim block so that the benefit of the buffer-aware block merge is maximized. Our experimental results show that BAGC improves I/O performance by up to 43 percent over existing buffer-unaware schemes for various benchmarks.
Index Terms:
Ash,System-on-a-chip,Registers,Buffer storage,Performance evaluation,Reliability,Educational institutions,garbage collection,NAND flash memory,flash translation layer (FTL),buffer management
Citation:
Sungjin Lee, Dongkun Shin, Jihong Kim, "BAGC: Buffer-Aware Garbage Collection for Flash-Based Storage Systems," IEEE Transactions on Computers, vol. 62, no. 11, pp. 2141-2154, Nov. 2013, doi:10.1109/TC.2012.227
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