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IEEE Transactions on Computers
Nov. 2013 (vol. 62 no. 11)
ISSN: 0018-9340
Table of Contents
Regular Papers
Nicolas Van Wambeke, CNRS;LAAS, Toulouse and Université de Toulouse, Toulouse
Ernesto Exposito, CNRS;LAAS, Toulouse and Université de Toulouse, Toulouse
Christophe Chassot, CNRS;LAAS, Toulouse and Université de Toulouse, Toulouse
Michel Diaz, CNRS;LAAS, Toulouse and Université de Toulouse, Toulouse
pp. 2131-2140
Sungjin Lee, Massachusetts Institute of Technology, Cambridge, MA
Dongkun Shin, Sungkyunkwan University, Suwon
Jihong Kim, Seoul National University, Seoul
pp. 2141-2154
Weirong Jiang, Xilinx, Inc., San Jose, CA
Viktor K. Prasanna, University of Southern California, Los Angeles
pp. 2169-2182
Seetharam Narasimhan, Case Western Reserve University, Cleveland
Dongdong Du, Hyland Software, Cleveland
Rajat Subhra Chakraborty, Indian Institute of Technology, Kharagpur
Somnath Paul, Intel Corp, Hillsboro
Francis G. Wolff, Case Western Reserve University, Cleveland
Christos A. Papachristou, Case Western Reserve University, Cleveland
Kaushik Roy, Purdue University, West Lafayette
Swarup Bhunia, Case Western Reserve University, Cleveland
pp. 2183-2195
Yang Wang, University of New Brunswick, Fredericton
Paul Lu, University of Alberta, Edmonton
pp. 2210-2223
Sushmita Ruj, Indian Statistical Institute, Kolkata, India
Amiya Nayak, University of Ottawa, Ottawa
Ivan Stojmenovic, University of Ottawa, Ottawa
pp. 2224-2237
Jonghun Yoo, Dept. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
Jaesoo Lee, Dept. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
Seongsoo Hong, Dept. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
pp. 2238-2251
Bo Zhao, University of Pittsburgh, Pittsburgh
Yu Du, University of Pittsburgh, Pittsburgh
Jun Yang, University of Pittsburgh, Pittsburgh
Youtao Zhang, University of Pittsburgh, Pittsburgh
pp. 2252-2265
Peng Xu, Huazhong University of Science and Technology, Wuhan
Hai Jin, Huazhong University of Science and Technology, Wuhan
Qianhong Wu, Beihang Univerisity, Beijing
Wei Wang, Peking University, Shenzhen
pp. 2266-2277
Karthik Pattabiraman, University of British Columbia, Vancouver
Nithin M. Nakka, Nexstest Systems, San Jose
Zbigniew T. Kalbarczyk, University of Illinois at Urbana-Champaign, Urbana
Ravishankar K. Iyer, University of Illinois at Urbana-Champaign, Urbana
pp. 2292-2307
Minsu Huang, University of North Carolina at Charlotte, Charlotte
Siyuan Chen, University of North Carolina at Charlotte, Charlotte
Ying Zhu, University of North Carolina at Charlotte, Charlotte
Yu Wang, University of North Carolina at Charlotte, Charlotte
pp. 2308-2321
Salvatore Pontarelli, University of Rome "Tor Vergata," Rome
Giuseppe Bianchi, University of Rome "Tor Vergata," Rome
Simone Teofili, University of Rome "Tor Vergata," Rome
pp. 2322-2334
Brief Contributions
Yining Liu, Huazhong University of Science and Technology, Wuhan
Chi Cheng, Wuhan National Laboratory for Optoelectronics, Wuhan
Jianyu Cao, Guilin University of Electronic Technology, Guilin
Tao Jiang, Huazhong University of Science and Technology, Wuhan
pp. 2335-2336
Qiang Zhu, Xidian University, Xi'an
Xin-Ke Wang, Xidian University, Xi'an
Guanglan Cheng, Xidian University, Xi'an
pp. 2337-2340
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