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Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells
Nov. 2012 (vol. 61 no. 11)
pp. 1576-1587
| ASCII Text | x | ||
| Jin-Fu Li, "Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells," IEEE Transactions on Computers, vol. 61, no. 11, pp. 1576-1587, Nov., 2012. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.2011.196, author = { Jin-Fu Li}, title = {Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells}, journal ={IEEE Transactions on Computers}, volume = {61}, number = {11}, issn = {0018-9340}, year = {2012}, pages = {1576-1587}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2011.196}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells IS - 11 SN - 0018-9340 SP1576 EP1587 EPD - 1576-1587 A1 - Jin-Fu Li, PY - 2012 KW - table lookup KW - content-addressable storage KW - fault diagnosis KW - erase operation KW - ternary content addressable memory KW - digital system KW - lookup operation KW - asymmetric TCAM cell KW - TCAM array KW - fault model KW - electrical defect KW - march-like test algorithm KW - write operation KW - march-like diagnosis algorithm KW - Fault detection KW - Memory management KW - Content management KW - ternary CAM KW - comparison fault KW - march test KW - Memory testing KW - diagnosis KW - content addressable memory (CAM) VL - 61 JA - IEEE Transactions on Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2011.196
Ternary content addressable memory (TCAM) is a key component in various digital systems due to its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. One march-like test algorithm TAC-H is also proposed to cover the defined comparison faults. The TAC-H consists of 8N Write operations and (3N + 2B) Compare operations for an N × B-bit TCAM with Hit output only. We also propose two march-like diagnosis algorithms to identify the defined comparison faults of TCAMs with asymmetric cells. The first diagnosis algorithm DAC-H requires 5N Write operations, 3N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit output only. The second diagnosis algorithm DAC-P requires 3N Write operations, 1N Erase operations, and (5N + 2B) Compare operations to distinguish 100 percent comparison faults for a TCAM with Hit and priority address encoder outputs.
Index Terms:
table lookup,content-addressable storage,fault diagnosis,erase operation,ternary content addressable memory,digital system,lookup operation,asymmetric TCAM cell,TCAM array,fault model,electrical defect,march-like test algorithm,write operation,march-like diagnosis algorithm,Fault detection,Memory management,Content management,ternary CAM,comparison fault,march test,Memory testing,diagnosis,content addressable memory (CAM)
Citation:
Jin-Fu Li, "Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells," IEEE Transactions on Computers, vol. 61, no. 11, pp. 1576-1587, Nov. 2012, doi:10.1109/TC.2011.196
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