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Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length
June 2012 (vol. 61 no. 6)
pp. 899-904
Irith Pomeranz, Purdue University, West Lafayette
Functional test sequences have several advantages over structural tests when they are applied at-speed. A large pool of functional test sequences may be available for a circuit due to the application of a simulation-based design verification process. This paper describes a versatile procedure that uses a pool of functional test sequences as a basis for forming a single compact functional test sequence that achieves the same or higher gate-level fault coverage than the given pool. The procedure extracts test subsequences from the test sequences in the pool and concatenates them to form a single test sequence. It also employs an enhanced static test compaction process aimed at improving the fault coverage in addition to reducing the test sequence length.

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Index Terms:
Functional test sequences, stuck-at faults, synchronous sequential circuits, transition faults.
Citation:
Irith Pomeranz, "Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length," IEEE Transactions on Computers, vol. 61, no. 6, pp. 899-904, June 2012, doi:10.1109/TC.2011.107
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