Issue No.06 - June (2012 vol.61)
Irith Pomeranz , Purdue University, West Lafayette
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2011.107
Functional test sequences have several advantages over structural tests when they are applied at-speed. A large pool of functional test sequences may be available for a circuit due to the application of a simulation-based design verification process. This paper describes a versatile procedure that uses a pool of functional test sequences as a basis for forming a single compact functional test sequence that achieves the same or higher gate-level fault coverage than the given pool. The procedure extracts test subsequences from the test sequences in the pool and concatenates them to form a single test sequence. It also employs an enhanced static test compaction process aimed at improving the fault coverage in addition to reducing the test sequence length.
Functional test sequences, stuck-at faults, synchronous sequential circuits, transition faults.
Irith Pomeranz, "Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length", IEEE Transactions on Computers, vol.61, no. 6, pp. 899-904, June 2012, doi:10.1109/TC.2011.107