Advanced Search 
IEEE Transactions on Computers
October 2011 (vol. 60 no. 10)
ISSN: 0018-9340
Table of Contents
Regular Papers
Chin-Yung Lu, National Taiwan University, Taipei
Shiou-An Wang, Delin Institute of Technology, Taipei
Sy-Yen Kuo, National Taiwan University, Taipei
pp. 1377-1389
Rahul Ratan, University of Maryland, College Park
A. Yavuz Oruç, University of Maryland, College Park
pp. 1390-1405
Chang Joo Lee, The Univerisity of Texas at Austin, Austin
Onur Mutlu, Carnegie Mellon University, Pittsburgh
Veynu Narasiman, The Univerisity of Texas at Austin, Austin
Yale N. Patt, The Univerisity of Texas at Austin, Austin
pp. 1406-1430
Ge-Ming Chiu, National Taiwan University of Science and Technology, Taipei
Li-Hsing Yen, National University of Kaohsiung, Kaohsiung
Tai-Lin Chin, National Taiwan University of Science and Technology, Taipei
pp. 1431-1444
Christophe Dubach, University of Edinburgh, Edinburgh
Timothy M. Jones, Edinburgh University, Edinburgh
Michael F.P. O'Boyle, University of Edinburgh, Edinburgh
pp. 1445-1458
Kazuteru Namba, Chiba University, Chiba-shi
Hideo Ito, Chiba University, Chiba-shi
pp. 1459-1470
Ge Nong, Sun Yat-sen University, Guangzhou
Sen Zhang, SUNY College at Oneonta, NY
Wai Hong Chan, Hong Kong Baptist University, Hong Kong
pp. 1471-1484
Amlan Ganguly, Washington State University, Pullman
Kevin Chang, Washington State University, Pullman
Sujay Deb, Washington State University, Pullman
Partha Pratim Pande, Washington State University, Pullman
Benjamin Belzer, Washington State University, Pullman
Christof Teuscher, Portland State University, Portland
pp. 1485-1502
Brief Contributions
Ching-Nung Yang, National Dong Hwa University, Hualien
Chih-Yang Chiu, National Dong Hwa University, Hualien
Gen-Cheng Wu, National Dong Hwa University, Hualien
pp. 1503-1510
Pedro Reviriego, Universidad Antonio de Nebrija, Madrid
Chris Bleakley, University College Dublin, Dublin
Juan Antonio Maestro, Universidad Antonio de Nebrija, Madrid
Anne O'Donnell, University College Dublin, Dublin
pp. 1511-1516
Call For Papers
Usage of this product signifies your acceptance of the Terms of Use.