Issue No.04 - April (2011 vol.60)
Adam B. Kinsman , McMaster University, Ontario, Canada
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2010.124
While a large body of work on output unknown (X) tolerance exists, to the best of the authors' knowledge, no study is provided in the literature which explores the trade-off between X density and compression of circuit stimuli without reducing fault coverage. To this end, we introduce an architectural and algorithmic framework through which we explore this trade-off, the findings of which we discuss in the experimental results section.
Test data compression, response X-masking.
Adam B. Kinsman, "Trade-Offs in Test Data Compression and Deterministic X-Masking of Responses", IEEE Transactions on Computers, vol.60, no. 4, pp. 498-507, April 2011, doi:10.1109/TC.2010.124