Advanced Search 
IEEE Transactions on Computers
September 2010 (vol. 59 no. 9)
ISSN: 0018-9340
Table of Contents
Guey-Yun Chang, National Central University, Taoyuan
pp. 1153-1157
Min Yang, SUNY at Stony Brook University, Stony Brook
Yuanyuan Yang, SUNY at Stony Brook University, Stony Brook
pp. 1158-1171
Paolo Valente, Università Di Modena, Modena
Fabio Checconi, Scuola Superiore, Sant' Anna, Pisa
pp. 1172-1186
Kyueun Yi, LG Electronics Inc., Seoul
Jean-Luc Gaudiot, University of California, Irvine, Irvine
pp. 1200-1209
Jack Whitham, University of York, York
Neil Audsley, University of York, York
pp. 1210-1223
Hannes Frey, University of Paderborn, Paderborn, Germany
Ivan Stojmenovic, University of Ottawa, Ontario, Canada
pp. 1224-1238
Chun-I Fan, National Sun Yat-sen University, Kaohsiung
Ling-Ying Huang, National Sun Yat-sen University, Kaohsiung
Pei-Hsiu Ho, National Sun Yat-sen University, Kaohsiung
pp. 1239-1249
Sylvain Guilley, TELECOM ParisTech, Paris
Laurent Sauvage, TELECOM ParisTech, Paris
Florent Flament, TELECOM ParisTech, Paris
Vinh-Nga Vong, Airbus, Toulouse, France
Philippe Hoogvorst, CNRS, Paris
Renaud Pacalet, TELECOM ParisTech, Paris
pp. 1250-1263
Kris Gaj, George Mason University, Fairfax
Soonhak Kwon, Sungkyunkwan University, Suwon
Patrick Baier, Siemens PLM Software
Paul Kohlbrenner, George Mason University, Fairfax
Hoang Le, University of Southern California, Los Angeles
Mohammed Khaleeluddin, Hughes Network Systems, Germantown
Ramakrishna Bachimanchi, Thomas Jefferson National Accelerator Facility
Marcin Rogawski, George Mason University, Fairfax
pp. 1264-1280
Madhukar Anand, Cisco Systems
Sebastian Fischmeister, University of Waterloo, Canada
Yerang Hur, Postdata America R & D Center
Jesung Kim, The MathWorks
Insup Lee, University of Pennsylvania, Philadelphia
pp. 1281-1294
Aaram Yun, University of Minnesota, Minneapolis
Jung Hee Cheon, Seoul National University, Seoul
Yongdae Kim, University of Minnesota, Minneapolis
pp. 1295-1296
Usage of this product signifies your acceptance of the Terms of Use.