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Stelios N. Neophytou, Maria K. Michael, "Test Set Generation with a Large Number of Unspecified Bits Using Static and Dynamic Techniques," IEEE Transactions on Computers, vol. 59, no. 3, pp. 301316, March, 2010.  
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@article{ 10.1109/TC.2009.178, author = {Stelios N. Neophytou and Maria K. Michael}, title = {Test Set Generation with a Large Number of Unspecified Bits Using Static and Dynamic Techniques}, journal ={IEEE Transactions on Computers}, volume = {59}, number = {3}, issn = {00189340}, year = {2010}, pages = {301316}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2009.178}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  Test Set Generation with a Large Number of Unspecified Bits Using Static and Dynamic Techniques IS  3 SN  00189340 SP301 EP316 EPD  301316 A1  Stelios N. Neophytou, A1  Maria K. Michael, PY  2010 KW  Reliability and testing KW  test generation KW  VLSI. VL  59 JA  IEEE Transactions on Computers ER   
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