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Issue No.12 - December (2008 vol.57)
pp: 1704-1713
Alfredo Benso , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Alberto Bosio , LIRMM, Montpellier
Stefano Di Carlo , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
Giorgio Di Natale , LIRMM, Montpellier
Paolo Prinetto , Politecnico di Torino, Dip. Automatica e Informatica, C.so Duca degli Abruzzi 24, Torino
ABSTRACT
Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms to detect them. March tests have proven to be a fast, simple and regularly structured class of memory test algorithms. This paper proposes a new polynomial algorithm to automatically generate march tests. The formal model adopted to represent memory faults allows the definition of a general methodology to deal with both static, dynamic and linked faults.
INDEX TERMS
Reliability, Testing, and Fault-Tolerance, Test generation
CITATION
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, "March Test Generation Revealed", IEEE Transactions on Computers, vol.57, no. 12, pp. 1704-1713, December 2008, doi:10.1109/TC.2008.105
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