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A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip
September 2008 (vol. 57 no. 9)
pp. 1-1
A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.

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Index Terms:
and Fault-Tolerance,Interconnections (Subsystems),Reliability,Testing
Citation:
"A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip," IEEE Transactions on Computers, vol. 57, no. 9, pp. 1-1, Sept. 2008, doi:10.1109/TC.2008.62
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