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Issue No.09 - September (2008 vol.57)
pp: 1
ABSTRACT
A novel strategy to detect interconnect faults between distinct channels in networks-on-chip is proposed. Short faults between distinct channels in the data, control and communication handshake lines are considered in a cost-effective test sequence for Mesh NoC topologies based on XY routing.
INDEX TERMS
and Fault-Tolerance, Interconnections (Subsystems), Reliability, Testing
CITATION
"A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip", IEEE Transactions on Computers, vol.57, no. 9, pp. 1, September 2008, doi:10.1109/TC.2008.62
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