The Community for Technology Leaders
RSS Icon
Issue No.08 - August (2008 vol.57)
pp: 1032-1045
Yiorgos Tsiatouhas , University Ioaninna, Ioannina
Themistoklis Haniotakis , University of Patras, Patras
Sotirios Matakias , University of Athens, Department of Informatics & Telecom, Athens
A current mode, periodic outputs, parallel two-rail code (TRC) checker, suitable for the implementation of high fan-in embedded checkers, is presented. The new checker is characterised by high testability, high speed operation and low silicon area requirements. The circuit has been designed, for various fan-in values, in a 0.18?m technology and electrical simulations have been carried out to validate its operation, considering process, power supply and temperature variations as well as variations of the electrical parameters.
Reliability, Testing, and Fault-Tolerance, Error-checking, Reliability and Testing, Error-checking, Integrated Circuits, VLSI, Reliability and Testing, Error-checking
Yiorgos Tsiatouhas, Themistoklis Haniotakis, Sotirios Matakias, "A Current Mode, Parallel, Two-Rail Code Checker", IEEE Transactions on Computers, vol.57, no. 8, pp. 1032-1045, August 2008, doi:10.1109/TC.2008.59
[1] J.W.C. Carter and P.R. Schneider, “Design of Dynamically Checked Computers,” Proc. Int'l Federation of Information Processing Congress, pp. 878-883, 1968.
[2] D.A. Anderson and G. Metze, “Design of Totally Self-Checking Circuits for $m$ -out-of-$n$ Codes,” IEEE Trans. Computers, vol. 22, pp.263-269, 1973.
[3] M. Nicolaidis and B. Courtois, “Strongly Code-Disjoint Checkers,” IEEE Trans. Computers, vol. 37, pp. 751-756, 1988.
[4] S. Tarnick, “Embedded Parity and Two-Rail TSC Checkers with Error Memorizing Capability,” Proc. IEEE On-Line Testing Workshop, pp. 221-225, 1995.
[5] C. Metra, M. Favali, and B. Ricco, “Embedded Two-Rail Checkers with On-Line Testing Ability,” Proc. IEEE VLSI Test Symp., pp.145-150, 1996.
[6] D. Nikolos, “Optimal Self-Testing Embedded Two-Rail Checkers,” Proc. IEEE On-Line Testing Workshop, pp. 154-161, 1996.
[7] D. Nikolos, “Self-Testing Embedded Two-Rail Checkers,” J.Electronic Testing: Theory and Applications, vol. 12, pp. 69-79, Feb.-Apr. 1998.
[8] S.J. Piestrac, “Design Method of a Class of Embedded Combinational Self-Testing Checkers for Two-Rail Codes,” IEEE Trans. Computers, vol. 51, no. 2, pp. 229-234, Feb. 2002.
[9] D. Nikolos, “Optimal Self-Testing Embedded Parity Checkers,” IEEE Trans. Computers, vol. 47, no. 3, pp. 313-321, Mar. 1998.
[10] F. Ozguner, “Design of Totally Self-Checking Embedded Two-Rail Code Checkers,” IEE Electronics Letters, vol. 27, no. 4, pp. 382-384, Feb. 1991.
[11] E. Fujiwara and K. Matsuoka, “A Self-Checking Generalized Prediction Checker and Its Use for Built-In Testing,” IEEE Trans. Computers, vol. 36, no. 1, pp. 86-93, Jan. 1987.
[12] S. Kundu and S.M. Reddy, “Embedded Totally Self-Checking Checkers: A Practical Design,” IEEE Design and Test of Computers, vol. 7, no. 4, pp. 5-12, Aug. 1990.
[13] M. Omana, D. Rossi, and C. Metra, “High Speed and Highly Testable Parallel Two-Rail Code Checker,” Proc. Design Automation and Test in Europe Conf., pp. 608-613, 2003.
[14] C. Efstathiou, “Efficient MOS Implementation of Totally Self-Checking Two-Rail Code Checkers,” Int. J. Electronics, vol. 68, no. 2, pp. 259-264, 1990.
[15] J.C. Lo, “A Novel Area-Time Efficient Static CMOS Totally Self-Checking Comparator,” IEEE J. Solid-State Circuits, vol. 28, no. 2, pp. 165-168, 1993.
[16] S. Kundu, E.S. Sogomonyan, M. Goessel, and S. Tarnick, “Self-Checking Comparator with One Periodic Output,” IEEE Trans. Computers, vol. 45, no. 3, pp. 379-380, Mar. 1996.
[17] C. Metra, M. Favali, and B. Ricco, “High Testable and Compact Single Output Comparator,” Proc. IEEE VLSI Test Symp., pp. 210-215, 1997.
[18] M. Omana, D. Rossi, and C. Metra, “Low Cost and High Speed Embedded Two-Rail Code Checker,” IEEE Trans. Computers, vol. 54, no. 2, pp. 153-164, Feb. 2005.
[19] S. Matakias, Y. Tsiatouhas, T. Haniotakis, A. Arapoyanni, and A. Efthymiou, “Fast, Parallel Two-Rail Code Checker with Enhanced Testability,” Proc. 11th IEEE Int'l On-Line Testing Symp., pp. 149-156, 2005.
[20] International Technology Roadmap for Semiconductors, http:/, 2008.
[21] R.R. Montanes, P. Volf, and J.P. de Gyvez, “Resistance Characterization for Weak Open Defects,” IEEE Design and Test of Computers, vol. 19, no. 5, pp. 18-26, Sept./Oct. 2002.
[22] J. Jahangiri and D. Abercrombie, “Value-Added Defect Testing Techniques,” IEEE Design and Test of Computers, vol. 22, no. 3, pp.224-231, May/June 2005.
[23] J.E. Smith and G. Metze, “Strongly Fault-Secure Logic Networks,” IEEE Trans. Computers, vol. 27, no. 6, pp. 491-499, June 1978.
[24] M. Nicolaidis, “Self-Exercising Checkers for Unified Built-In Self-Test (UBIST),” IEEE Trans. Computer-Aided Design, vol. 8, pp. 203-218, 1989.
[25] M. Bohr, R. Chau, T. Ghani, and K. Mistry, “The High-k Solution,” IEEE Spectrum, vol. 44, no. 10, pp. 23-29, Oct. 2007.
[26] N. Gaitanis, “An Asynchronous Totally Self-Checking Two-Rail Code Error Indicator,” Proc. IEEE VLSI Test Symp., pp. 151-156, 1996.
23 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool