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X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
July 2008 (vol. 57 no. 7)
pp. 978-989
ASCII Text
x 
 
Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei, "X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors," IEEE Transactions on Computers, vol. 57, no. 7, pp. 978-989, July, 2008.
 
 
BibTex
x
 
@article{ 10.1109/TC.2007.70833,
author = {Seongmoon Wang and Kedarnath J. Balakrishnan and Wenlong Wei},
title = {X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors},
journal ={IEEE Transactions on Computers},
volume = {57},
number = {7},
issn = {0018-9340},
year = {2008},
pages = {978-989},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2007.70833},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
IS - 7
SN - 0018-9340
SP978
EP989
EPD - 978-989
A1 - Seongmoon Wang,
A1 - Kedarnath J. Balakrishnan,
A1 - Wenlong Wei,
PY - 2008
KW - output compaction
KW - response compaction
KW - test data compression
KW - temporal compactor
KW - blocking unknown values
KW - MISR
KW - BIST
KW - Built-in Self-Test
KW - LFSR reseeding
VL - 57
JA - IEEE Transactions on Computers
ER -
 
This paper presents an efficient method to block unknown values for temporal compactors. The control signals for the blocking logic are generated by a linear feedback shift register (LFSR). Control patterns, which describe values required at the control signals of the blocking logic, are compressed by LFSR reseeding. The size of the control LFSR, which is determined by the number of specified bits in the most specified control pattern, is minimized by propagating only one fault effect for each fault and targeting the faults that are uniquely detected by each test pattern. The linear solver to find seeds of the LFSR intelligently chooses a solution such that the impact on test quality is minimal. Very high compression (over 230X) is achieved for benchmark and industrial circuits by the proposed method. Experimental results show that sizes of control data for the proposed method are smaller than prior work and run time of the proposed method is several orders of magnitude smaller than that of prior work. Hardware overhead is very low.

[1] B. Könemann, “A SmartBIST Variant with Guaranteed Encoding,” Proc. Asian Test Symp., pp. 325-330, 2001.
[2] J. Rajski et al., “Embedded Deterministic Test for Low Cost Manufacturing Test,” Proc. IEEE Int'l Test Conf., pp. 301-310, 2002.
[3] S. Mitra and K.S. Kim, “X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction,” Proc. IEEE Int'l Test Conf., pp. 311-320, 2002.
[4] J. Rajski, J. Tyszer, C. Wang, and S.M. Reddy, “Convolutional Compaction of Test Responses,” Proc. IEEE Int'l Test Conf., pp.745-754, 2003.
[5] C. Wang, S.M. Reddy, I. Pomeranz, J. Rajski, and J. Tyszer, “On Compacting Test Response Data Containing Unknown Values,” Proc. IEEE Int'l Conf. Computer-Aided Design, pp. 855-862, 2003.
[6] P. Wohl, J.A. Waicukauski, and S. Patel, “Scalable Selector Architecture for X-Tolerant Deterministic BIST,” Proc. IEEE-ACM Design Automation Conf., pp. 934-939, 2004.
[7] E.H. Volkerink and S. Mitra, “Response Compaction with Any Number of Unknowns Using a New LFSR Architecture,” Proc. IEEE-ACM Design Automation Conf., pp. 117-122, 2005.
[8] J. Rajski et al., “X-Press Compactor for 1000x Reduction of Test Data,” Proc. IEEE Int'l Test Conf., pp. 1-10, 2006.
[9] H. Tang, C. Wang, J. Rajski, S.M. Reddy, J. Tyszer, and I. Pomeranz, “On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios,” Proc. Int'l Conf. VLSI Design, pp. 59-64, 2005.
[10] V. Chickermane, B. Foutz, and B. Keller, “Channel Masking Synthesis for Efficient On-Chip Test Compression,” Proc. IEEE Int'l Test Conf., pp. 452-461, 2004.
[11] M. Naruse, I. Pomeranz, S.M. Reddy, and S. Kundu, “On-Chip Compression of Output Responses with Unknown Values Using LFSR Reseeding,” Proc. IEEE Int'l Test Conf., pp. 1060-1068, 2003.
[12] B. Könemann, “LFSR-Coded Test Patterns for Scan Designs,” Proc. European Test Conf., pp. 237-242, 1991.
[13] Y. Tang et al., “X-Masking during Logic BIST and Its Impact on Defect Coverage,” IEEE Trans. VLSI Systems, vol. 14, no. 2, pp. 193-202, Feb. 2006.
[14] J. Rajski, N. Tamarapalli, and J. Tyszer, “Automated Synthesis of Phase Shifters for Built-In Self-Test Applications,” IEEE Trans. Computer-Aided Design of Integrated Circuit and System, vol. 19, pp.1175-1188, Oct. 2000.
[15] P.H. Bardell, W.H. McAnney, and J. Savir, Built-In Test for VLSI: Pseudorandom Techniques. John Wiley & Sons, 1987.
[16] T.H. Cormen, C.E. Leiserson, and R.L. Rivest, Introduction to Algorithm. MIT Press, 1990.
[17] B. Benware, C. Schuermyer, S. Ranganathan, R. Madge, P. Krishnamurthy, N. Tamarapalli, K.-H. Tsai, and J. Rajski, “Impact of Multiple-Detect Test Patterns on Product Quality,” Proc. IEEE Int'l Test Conf., pp. 1031-1040, 2003.
[18] C.-T.M. Chao, S. Wang, S.T. Chakradhar, and K.-T. Cheng, “Response Shaper: A Novel Technique to Enhance Unknown Tolerance for Output Response Compaction,” Proc. IEEE Int'l Conf. Computer-Aided Design, pp. 80-87, 2005.
[19] H.-J. Wunderlich and G. Kiefer, “Bit-Flipping BIST,” Proc. IEEE Int'l Conf. Computer-Aided Design, pp. 337-343, 1996.

Index Terms:
output compaction, response compaction, test data compression, temporal compactor, blocking unknown values, MISR, BIST, Built-in Self-Test, LFSR reseeding
Citation:
Seongmoon Wang, Kedarnath J. Balakrishnan, Wenlong Wei, "X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors," IEEE Transactions on Computers, vol. 57, no. 7, pp. 978-989, July 2008, doi:10.1109/TC.2007.70833
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