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SunYuan Hsieh, YuShu Chen, "Strongly Diagnosable Product Networks Under the Comparison Diagnosis Model," IEEE Transactions on Computers, vol. 57, no. 6, pp. 721732, June, 2008.  
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@article{ 10.1109/TC.2008.30, author = {SunYuan Hsieh and YuShu Chen}, title = {Strongly Diagnosable Product Networks Under the Comparison Diagnosis Model}, journal ={IEEE Transactions on Computers}, volume = {57}, number = {6}, issn = {00189340}, year = {2008}, pages = {721732}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2008.30}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Strongly Diagnosable Product Networks Under the Comparison Diagnosis Model IS  6 SN  00189340 SP721 EP732 EPD  721732 A1  SunYuan Hsieh, A1  YuShu Chen, PY  2008 KW  Reliability KW  Testing KW  and FaultTolerance KW  Fault tolerance KW  Measurement KW  evaluation KW  modeling KW  simulation of multipleprocessor systems KW  Onchip interconnection networks KW  Graph Theory KW  Discrete Mathematics KW  Mathematics of Computing KW  Network problems KW  Graph Theory KW  Discrete Mathematics KW  Mathematics of Computing VL  57 JA  IEEE Transactions on Computers ER   
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