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Xiaoding Chen, Michael S. Hsiao, "Testing Embedded Sequential Cores in Parallel Using SpectrumBased BIST," IEEE Transactions on Computers, vol. 55, no. 2, pp. 150162, February, 2006.  
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@article{ 10.1109/TC.2006.30, author = {Xiaoding Chen and Michael S. Hsiao}, title = {Testing Embedded Sequential Cores in Parallel Using SpectrumBased BIST}, journal ={IEEE Transactions on Computers}, volume = {55}, number = {2}, issn = {00189340}, year = {2006}, pages = {150162}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2006.30}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Testing Embedded Sequential Cores in Parallel Using SpectrumBased BIST IS  2 SN  00189340 SP150 EP162 EPD  150162 A1  Xiaoding Chen, A1  Michael S. Hsiao, PY  2006 KW  Index Terms Systemonachip KW  builtinselftest KW  spectral analysis. VL  55 JA  IEEE Transactions on Computers ER   
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