• J.-C. Lo is with the Department of Electrical and Computer Engineering, University of Rhode Island, Kingston, RI 02881. E-mail: firstname.lastname@example.org.
• C. Metra is with DEIS-University of Bologna, Viale Risorgimento 2, 40136 Bologna, Italy. E-mail: email@example.com.
• F. Lombardi is with the Department of Electrical and Computer Engineering, Northeastern University, 110 Forsyth Street, Building 309 Dana, Boston, MA 02115. E-mail: firstname.lastname@example.org.
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Jien-Chung Lo received the MS and PhD degrees in computer engineering from the University of Louisiana, Lafayette, Louisiana, in 1987 and 1989, respectively. Since 1989, he has been with the University of Rhode Island, where he is currently a professor and director of the Computer Engineering Program in the Department of Electrical and Computer Engineering. In 1999, he cofounded the Laboratory for Electronic Testing at the University of Rhode Island with support from the State of Rhode Island and Cherry Semiconductor Inc. He has served on program and steering committees of various IEEE conferences. He served as an associate editor of the IEEE Transactions on Computers from 2001-2005. He has been working on concurrent error detection, fault-tolerant computing, dependable logic design synthesis, mixed-signal testing, on-chip power, and jitter measurement. He has published extensively in the above areas and holds two US patents.
Cecilia Metra received the degree (summa cum laude) in electronic engineering and the PhD degree in electronic engineering and computer science from the University of Bologna, Italy, where she is currently an associate professor in electronics. Dr. Metra is/has been a member of the steering and technical program committees of several international conferences. She is an associate editor of the IEEE Transactions on Computers and Journal of Electronic Testing: Theory and Applications and a member of the editorial board of the Microelectronics Journal. Her research interests are in the field of design and test of digital systems, fault tolerance, online testing, reliable and error resilient systems, fault modeling, and concurrent diagnosis.
Fabrizio Lombardi graduated in 1977 from the University of Essex, United Kingdom, with the BSc (Hons) degree in electronic engineering. In 1977, he joined the Microwave Research Unit at University College London, where he received the master's degree in microwaves and modern optics (1978), the Diploma in microwave engineering (1978), and the PhD degree from the University of London (1982). He is currently the holder of the International Test Conference (ITC) Endowed Professorship at Northeastern University, Boston. Since 2000, he has been the associate editor-in-chief of the IEEE Transactions on Computers and an associate editor of IEEE Design and Test. He also serves as the chair of the committee on "Nanotechnology Devices and Systems" of the Test Technology Technical Council of the IEEE. His research interests are testing and design of digital systems, quantum and nano computing, configurable/network computing, defect tolerance, and CAD VLSI. He has extensively published in these areas and edited six books.