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Ioannis Voyiatzis, "Test Vector Embedding into AccumulatorGenerated Sequences: A LinearTime Solution," IEEE Transactions on Computers, vol. 54, no. 4, pp. 476484, April, 2005.  
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@article{ 10.1109/TC.2005.69, author = {Ioannis Voyiatzis}, title = {Test Vector Embedding into AccumulatorGenerated Sequences: A LinearTime Solution}, journal ={IEEE Transactions on Computers}, volume = {54}, number = {4}, issn = {00189340}, year = {2005}, pages = {476484}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2005.69}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Test Vector Embedding into AccumulatorGenerated Sequences: A LinearTime Solution IS  4 SN  00189340 SP476 EP484 EPD  476484 A1  Ioannis Voyiatzis, PY  2005 KW  Builtin selftest KW  test set embedding KW  accumulatorbased test pattern generation. VL  54 JA  IEEE Transactions on Computers ER   
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