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A Measure of Quality for n-Detection Test Sets
November 2004 (vol. 53 no. 11)
pp. 1497-1503
ASCII Text
x 
 
Irith Pomeranz, Sudhakar M. Reddy, "A Measure of Quality for n-Detection Test Sets," IEEE Transactions on Computers, vol. 53, no. 11, pp. 1497-1503, November, 2004.
 
 
BibTex
x
 
@article{ 10.1109/TC.2004.87,
author = {Irith Pomeranz and Sudhakar M. Reddy},
title = {A Measure of Quality for n-Detection Test Sets},
journal ={IEEE Transactions on Computers},
volume = {53},
number = {11},
issn = {0018-9340},
year = {2004},
pages = {1497-1503},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.2004.87},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - A Measure of Quality for n-Detection Test Sets
IS - 11
SN - 0018-9340
SP1497
EP1503
EPD - 1497-1503
A1 - Irith Pomeranz,
A1 - Sudhakar M. Reddy,
PY - 2004
KW - n-detection tests
KW - test set ordering
KW - unmodeled faults.
VL - 53
JA - IEEE Transactions on Computers
ER -
 
n-detection test sets are useful in improving the coverage of unmodeled faults. We introduce a measure of quality that allows us to compare two test sets in terms of their ability to detect unmodeled faults based on the concept of n-detections. Using this measure, we describe a procedure for ordering an n-detection test set for stuck-at faults such that the quality of a test set comprised of the first K tests of the test set is as high as possible. This is useful when only K tests of the test set can be accommodated in the tester memory or to help ensure that unmodeled faults are detected as early as possible during the test application process. We present experimental results demonstrating that the proposed ordering yields test sets with increased coverage of unmodeled faults.

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Index Terms:
n-detection tests, test set ordering, unmodeled faults.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "A Measure of Quality for n-Detection Test Sets," IEEE Transactions on Computers, vol. 53, no. 11, pp. 1497-1503, Nov. 2004, doi:10.1109/TC.2004.87
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