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On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential Circuit
September 2004 (vol. 53 no. 9)
pp. 1121-1133
When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many faults as possible is required. Motivated by this application, we address the following problem. Given a test sequence T of length L for a synchronous sequential circuit and a length M

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Index Terms:
Synchronous sequential circuits, test application time, test compaction.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential Circuit," IEEE Transactions on Computers, vol. 53, no. 9, pp. 1121-1133, Sept. 2004, doi:10.1109/TC.2004.63
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