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Multiple-Seed TPG Structures
December 2003 (vol. 52 no. 12)
pp. 1633-1639

Abstract—Linear Feedback Shift Registers (LFSRs) are popular mechanisms for built-in test pattern generation (TPG). They are normally used with a primitive characteristic polynomial because, in that case, only one initialization state (seed) is required. In this paper, we show that if the characteristic polynomial is nonprimitive irreducible, the required seeds can still be efficiently generated. We establish a formula that shows how the seeds of any nonprimitive irreducible polynomial relate to each other. This leads to an efficient hardware implementation with small hardware overhead, irrespective of the number of seeds, and enhances the choices available for the design of appropriate TPG structures in the case of pseudoexhaustive TPG that were previously limited to primitive characteristic polynomials only.

[1] M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design. New York: Computer Science Press, 1990.
[2] P.H. Bardell, "Calculating the Effects of Linear Dependencies on m-Sequences Used as Test Stimuli," IEEE Trans. CAD of Integrated Circuits and Systems, vol. 11, no. 1, Jan. 1992, pp. 83-86.
[3] P.H. Bardell, W.H. McAnney, and J. Savir, Built-In Test for VLSI, John Wiley&Sons, New York, 1987.
[4] Z. Barzilai, D. Coppersmith, and A.L. Rosenberg, Exhaustive Bit Generation with Application to VLSI Self-Testing IEEE Trans. Computers, vol. 32, pp. 190-194, 1983.
[5] C.L. Chen, "Linear Dependencies in Linear Feedback Shift Registers," IEEE Trans. Computers, vol. 32, no. 12, Dec. 1986, pp. 1086-1088.
[6] W.-B. Jone and C.A. Papachristou, A Coordinated Approach to Partitioning and Test Pattern Generation for Pseudoexhaustive Testing Proc. 26th ACM/IEEE Design Automation Conf., pp. 525-530, 1989.
[7] D. Kagaris, F. Makedon, and S. Tragoudas, A Method for Pseudo-Exhaustive Test Pattern Generation IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 13, no. 9, pp. 1170-1178, 1994.
[8] D. Kagaris and S. Tragoudas, Avoiding Linear Dependencies in LFSR Test Pattern Generators J. Electronic Testing: Theory and Applications, vol. 6, pp. 229-241, 1995.
[9] D. Kagaris and S. Tragoudas, Pseudoexhaustive TPG with a Provably Low Number of LFSR Seeds Proc. IEEE Int'l Conf. Computer Design, pp. 42-47, Sept. 2000.
[10] A. Lempel and M. Cohn, Design of Universal Test Sequences for VLSI IEEE Trans. Information Theory, vol. 31, no. 1, pp. 10-15, 1985.
[11] R. Lidl and H. Niederreiter,An Introduction to Finite Fields and Their Applications.Cambridge: Cambridge Univ. Press, 1986.
[12] G. Mrugalski, J. Rajski, and J. Tyszer, Cellular Automata-Based Test Pattern Generators with Phase Shifters IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 19, no. 8, pp. 878-893, 2000.
[13] W.W. Peterson and E.J. Weldon, Error-Correcting Codes, second ed. Cambridge, Mass.: MIT Press, 1972.
[14] J. Rajski and J. Tyszer, "On Linear Dependencies in Subspaces of LFSR-Generated Sequences," IEEE Trans. Computers, vol. 45, no. 10, Oct. 1996, pp. 1212-1216.
[15] R. Srinivasan, S.K. Gupta, and M.A. Breuer, “Novel Test Patttern Generators for Pseudo-Exhaustive Testing,” Proc. Int'l Test Conf., pp. 1,041-1,050, Oct. 1993.
[16] H.S. Stone, Discrete Mathematical Structures and Their Applications. Chicago: Science Research Assoc., 1973.
[17] D.T. Tang and C.L. Chen, Logic Test Pattern Generation Using Linear Codes IEEE Trans. Computers, vol. 33, no 9, pp. 845-850, Sept. 1984.
[18] H.-J. Wunderlich and S. Hellebrand, Tools and Devices Supporting the Pseudo-Exhaustive Test Proc. European Design Automation Conf., 1990.

Index Terms:
Test Pattern Generation (TPG), Built-In Self-Test (BIST), Linear Feedback Shift Registers (LFSRs).
Citation:
Dimitri Kagaris, "Multiple-Seed TPG Structures," IEEE Transactions on Computers, vol. 52, no. 12, pp. 1633-1639, Dec. 2003, doi:10.1109/TC.2003.1252858
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